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S. Hembacher

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cond-mat.mtrl-sci cond-mat.other cond-mat.str-el cond-mat.supr-con

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preprint2005arXiv

Focussing quantum states

Does the size of atoms present a lower limit to the size of electronic structures that can be fabricated in solids? This limit can be overcome by using devices that exploit quantum mechanical scattering of electron waves at atoms arranged in focussing geometries on selected surfaces. Calculations reveal that features smaller than a hydrogen atom can be obtained. These structures are potentially useful for device applications and offer a route to the fabrication of ultrafine and well defined tips for scanning tunneling microscopy.

preprint2003arXiv

Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K

The current-induced dissipation in YBCO grain boundary tunnel junctions has been measured between 4.2 K and 300 K. It is found that the resistance of 45 degree (100)/(110) junctions decreases linearly by a factor of four when their temperature is increased from 100 K to 300 K. At the superconducting transition temperature Tc the grain boundary resistance of the normal state and of the superconducting state extrapolate to the same value.

preprint2001arXiv

Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.