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S. A. Pauli

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Published work

3 published item(s)

preprint2010arXiv

Evolution of the interfacial structure of LaAlO3 on SrTiO3

The evolution of the atomic structure of LaAlO3 grown on SrTiO3 was investigated using surface x-ray diffraction in conjunction with model-independent, phase-retrieval algorithms between two and five monolayers film thickness. A depolarizing buckling is observed between cation and oxygen positions in response to the electric field of polar LaAlO3, which decreases with increasing film thickness. We explain this in terms of competition between elastic strain energy, electrostatic energy, and electronic reconstructions. The findings are qualitatively reproduced by density-functional theory calculations. Significant cationic intermixing across the interface extends approximately three monolayers for all film thicknesses. The interfaces of films thinner than four monolayers therefore extend to the surface, which might affect conductivity.

preprint2010arXiv

Graphene on Ru(0001): A corrugated and chiral structure

We present a structural analysis of the graphene/Ru(0001) system obtained by surface x-ray diffraction. The data were fit using Fourier-series expanded displacement fields from an ideal bulk structure, plus the application of symmetry constraints. The shape of the observed superstructure rods proves a reconstruction of the substrate, induced by strong bonding of graphene to ruthenium. Both the graphene layer and the underlying substrate are corrugated, with peak-to-peak heights of (0.82 +/- 0.15) A and (0.19 +/- 0.02) A for the graphene and topmost Ru-atomic layer, respectively. The Ru-corrugation decays slowly over several monolayers into the bulk. The system also exhibits chirality, whereby in-plane rotations of up to 2.0 degrees in those regions of the superstructure where the graphene is weakly bound are driven by elastic energy minimization.

preprint2009arXiv

Profiling the interface electron gas of LaAlO3/SrTiO3 heterostructures by hard X-ray photoelectron spectroscopy

The conducting interface of LaAlO$_3$/SrTiO$_3$ heterostructures has been studied by hard X-ray photoelectron spectroscopy. From the Ti~2$p$ signal and its angle-dependence we derive that the thickness of the electron gas is much smaller than the probing depth of 4 nm and that the carrier densities vary with increasing number of LaAlO$_3$ overlayers. Our results point to an electronic reconstruction in the LaAlO$_3$ overlayer as the driving mechanism for the conducting interface and corroborate the recent interpretation of the superconducting ground state as being of the Berezinskii-Kosterlitz-Thouless type.