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Ryung Kim

Ryung Kim contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2026arXiv

On the estimation of inclusion probabilities for weighted analyses of nested case control studies

Nested case-control (NCC) studies are a widely adopted design in epidemiology to investigate exposure-disease relationships. This paper examines weighted analyses in NCC studies, focusing on two prominent weighting methods: Kaplan-Meier (KM) weights and Generalized Additive Model (GAM) weights. We consider three target estimands: log-hazard ratios, conditional survival, and associations between exposures. While KM- and GAM-weights are generally robust, we identify specific scenarios where they can lead to biased estimates. We demonstrate that KM-weights can lead to biased estimates when a proportion of the originating cohort is effectively ineligible for NCC selection, particularly with small case proportions or numerous matching factors. Instead, GAM-weights can yield biased results if interactions between matching factors influence disease risk and are not adequately incorporated into weight calculation. Using Directed Acyclic Graphs (DAGs), we develop a framework to systematically determine which variables should be included in weight calculations. We show that the optimal set of variables depends on the target estimand and the causal relationships between matching factors, exposures, and disease risk. We illustrate our findings with both synthetic and real data from the European Prospective Investigation into Cancer and nutrition (EPIC) study. Additionally, we extend the application of GAM-weights to "untypical" NCC studies, where only a subset of cases are included. Our work provides crucial insights for conducting accurate and robust weighted analyses in NCC studies.

preprint2022arXiv

Experimental verification of polar structures in ultrathin BaTiO_{3} layers using resonant x-ray reflectivity

Functional devices with ultrathin ferroelectric layers have been attracted as a promising candidate for next-generation memory and logic device applications. Using the ultrathin ferroelectric layers, particularly approaching the two-dimensional limit, however, it is still challenging to control ferroelectric switching and to observe ferroelectricity by spectroscopic tools. In particular, conventional methods such as electrical measurements and piezoelectric response force microscopy are very limited due to leakage currents and the smallness of the ferroelectric signals. Here, we show that the ferroelectricity of ultrathin SrRuO3/BaTiO3/SrRuO3 heterostructures grown on SrTiO3(100) substrates can be measured using resonant x-ray reflectivity (RXRR). This experimental technique can provide an element-specific electronic depth profile as well as increased sensitivity to Ti off-center displacements at the Ti K pre-edge. The depth-sensitivity of RXRR selectively detects the strong polarization dependence of the Ti pre-edge features of ultrathin BaTiO3 layers while discriminating the contribution of the SrTiO3 substrate. This technique verified that the BaTiO3 layer can be ferroelectric down to the lowest experimental limit of a critical thickness of 2.5 unit cells. Our results can open a novel way to explore ultrathin ferroelectric-based nano-electronic devices.