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Roy Shiloh

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Published work

3 published item(s)

preprint2022arXiv

Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing

Not long after the laser was invented, it has been marked as a candidate source of strong, high-frequency electromagnetic radiation for acceleration of particles. Indeed, while the complex particle accelerator facilities today are an astonishing culmination of decades of work contributed by generations of physicists, engineers, and a host of scientists, new trends and acceleration technologies have been recently proposed and demonstrated. One of these technologies involves the miniaturization of particle accelerators, which is achieved by replacing the radio-frequency electromagnetic fields accelerating the particles with fields in the optical frequency range, using lasers. This entails using nanophotonics structures to provide the required field distribution. Recently, individual elements towards the nanophotonics counterpart of RF accelerators have been demonstrated. Similarly, active electron transport through such a structure has been shown, which was based on the concept of alternating phase focusing. In this contribution, we discuss and augment on the recently-demonstrated principle of alternating phase focusing using optical frequencies, and provide new insights from relevant simulations and experiments. In particular, we show how to identify possible imprecisions and parasitic effects from time delay scans and discuss how the transmission of electrons through the nanometric structure depends on the temporal overlap between electron and laser pulses, and show how the incidence angle of the electron beam can affect the measured transmission of electrons through the structure.

preprint2014arXiv

Sculpturing the Electron Wave Function

Coherent electrons such as those in electron microscopes, exhibit wave phenomena and may be described by the paraxial wave equation. In analogy to light-waves, governed by the same equation, these electrons share many of the fundamental traits and dynamics of photons. Today, spatial manipulation of electron beams is achieved mainly using electrostatic and magnetic fields. Other demonstrations include simple phase-plates and holographic masks based on binary diffraction gratings. Altering the spatial profile of the beam may be proven useful in many fields incorporating phase microscopy, electron holography, and electron-matter interactions. These methods, however, are fundamentally limited due to energy distribution to undesired diffraction orders as well as by their binary construction. Here we present a new method in electron-optics for arbitrarily shaping of electron beams, by precisely controlling an engineered pattern of thicknesses on a thin-membrane, thereby molding the spatial phase of the electron wavefront. Aided by the past decade's monumental leap in nano-fabrication technology and armed with light-optic's vast experience and knowledge, one may now spatially manipulate an electron beam's phase in much the same way light waves are shaped simply by passing them through glass elements such as refractive and diffractive lenses. We show examples of binary and continuous phase-plates and demonstrate the ability to generate arbitrary shapes of the electron wave function using a holographic phase-mask. This opens exciting new possibilities for microscopic studies of materials using shaped electron beams and enables electron beam lithography without the need to move the electron beam or the sample, as well as high resolution inspection of electronic chips by structured electron illumination.

preprint2014arXiv

Unveiling the orbital angular momentum and acceleration of electron beams

New forms of electron beams have been intensively investigated recently, including vortex beams carrying orbital angular momentum, as well as Airy beams propagating along a parabolic trajectory. Their traits may be harnessed for applications in materials science, electron microscopy and interferometry, and so it is important to measure their properties with ease. Here we show how one may immediately quantify these beams' parameters without need for additional fabrication or non-standard microscopic tools. Our experimental results are backed by numerical simulations and analytic derivation.