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Q. Peng

Q. Peng contributes to research discovery and scholarly infrastructure.

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hep-ex cond-mat.mtrl-sci nucl-ex physics.chem-ph physics.ins-det

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preprint2012arXiv

Detailed Report of the MuLan Measurement of the Positive Muon Lifetime and Determination of the Fermi Constant

We present a detailed report of the method, setup, analysis and results of a precision measurement of the positive muon lifetime. The experiment was conducted at the Paul Scherrer Institute using a time-structured, nearly 100%-polarized, surface muon beam and a segmented, fast-timing, plastic scintillator array. The measurement employed two target arrangements; a magnetized ferromagnetic target with a ~4 kG internal magnetic field and a crystal quartz target in a 130 G external magnetic field. Approximately 1.6 x 10^{12} positrons were accumulated and together the data yield a muon lifetime of tau_{mu}(MuLan) = 2196980.3(2.2) ps (1.0 ppm), thirty times more precise than previous generations of lifetime experiments. The lifetime measurement yields the most accurate value of the Fermi constant G_F (MuLan) = 1.1663787(6) x 10^{-5} GeV^{-2} (0.5 ppm). It also enables new precision studies of weak interactions via lifetime measurements of muonic atoms.

preprint2012arXiv

High resolution SIMS depth profiling of nanolayers

We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO and ZnO ~5.5 nm layers grown on a Si substrate by atomic layer deposition. The measurements were performed using a newly developed approach implementing a low energy direct current normally incident Ar+ ion beam for sample material removal by sputtering (250 eV and 500 eV energy), in combination with a pulsed 5 keV Ar+ ion beam at 60° incidence for TOF SIMS analysis. By this optimized arrangement, a noticeably improved version of known dual-beam (DB) approach to TOF SIMS depth profiling is introduced, which can be called gentleDB. We apply the mixing-roughness-information model to detailed analysis of experimental results. It reveals that the gentleDB approach allows ultimate depth resolution by confining the ion beam mixing length to about 2 monolayers. This corresponds to the escape depth of secondary ions, the fundamental depth resolution limitation in SIMS. Other parameters deduced from the measured depth profiles indicate that a single layer thickness equals to 6 nm so that "flat" layer thickness d is of 3 nm and interfacial roughness σ is of 1.5 nm thus yielding d+2\bulletσ=6 nm. In essence, we have demonstrated that the gentleDB TOF SIMS depth profiling with noble gas ion beams is capable of revealing structural features of a stack of nanolayers, resolving its original surface and estimating the roughness of interlayer interfaces, which is difficult to obtain by traditional approaches.

preprint2009arXiv

An Improved Limit on the Muon Electric Dipole Moment

Three independent searches for an electric dipole moment (EDM) of the positive and negative muons have been performed, using spin precession data from the muon g-2 storage ring at Brookhaven National Laboratory. Details on the experimental apparatus and the three analyses are presented. Since the individual results on the positive and negative muon, as well as the combined result, d=-0.1(0.9)E-19 e-cm, are all consistent with zero, we set a new muon EDM limit, |d| < 1.9E-19 e-cm (95% C.L.). This represents a factor of 5 improvement over the previous best limit on the muon EDM.