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Peter Moeck

Peter Moeck appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mtrl-sciphysics.app-phphysics.atm-clusphysics.ed-phphysics.ins-detquant-ph

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Published work

6 published item(s)

preprint2022arXiv

A Computer Program for Objective Point Symmetry Classifications of Pseudosymmetric Electron Diffraction Spot Patterns

A Python program for calculating the metrics necessary to perform information-theory based symmetry classifications and quantifications of transmission electron diffraction spot patterns is introduced. It is the first of its kind, in that it implements objectivity into crystallographic symmetry classifications and quantifications of approximate zone axis patterns from crystals. The equations by which the program operates as well as the required inputs are given. The results of the program's analysis of an experimental transmission electron diffraction spot pattern from a crystal with a pseudo-hexagonal lattice metric and a rectangular-centered Bravias lattice is used as an example. The program will eventually be appended to allow analysis of the other hierarchical translational pseudo-symmetry and Bravais lattice type combinations. Crystallographic Rsym values of traditional classifications into projected point symmetry groups are provided alongside information-theoretic results of the new program's analysis for comparison purposes.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Information-theoretic point symmetry classifications/quantifications of an electron diffraction spot pattern from a crystal with strong translational pseudosymmetry

The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the analysis of an experimental selected-area transmission electron diffraction spot pattern. The extracted lattice parameters of this crystal are within experimental error bars consistent with a metric tensor that suggests the presence of hexagonal translation symmetry. The point symmetry of the combined low, medium, and high resolution spots is, however, no higher than 2mm. The likelihood of this electron diffraction pattern belonging to a rectangular-centered crystal rather than a hexagonal crystal is quantified on the basis of its information-theoretic point group symmetry classifications. Presumably due to a slight misorientation away from the exact [001] zone axis combined with the curvature of the Ewald sphere and a real structure that includes intergrowth of quadruple NbO and triple BaNbO3 blocks of varying sizes and orientations, the group of highest resolution spots, i.e. d-spacings between 0.125 to 0.085 nm, feature point symmetry .m. only. The crystallographic Rsym values of traditional classifications into the point groups that are compatible with the experimentally obtained primitive lattice parameters are provided for comparison purposes. As it is common practice in diffraction based crystallography, point symmetry classification and quantification results for the group of highest resolution spots are provided separately from their counterparts for the combined low, medium, and high resolution spots.

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preprint2022arXiv

Objective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Metric

The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the analysis of an experimental electron diffraction spot pattern, for the first time. Digital input data are considered in this approach to consist of the pixel-wise sums of approximately Gaussian distributed noise and an unknown underlying signal that is strictly 2D periodic. Structural defects within the crystals or on the crystal surfaces, instrumental image recording noise, slight deviations from zero-crystal-tilt conditions in transmission electron microscopy, inhomogeneous staining in structural biology studies of intrinsic membrane protein complexes in lipid bilayers, and small inaccuracies in the algorithmic processing of the digital data all contribute to a single generalized noise term. The plane symmetry group and projected Laue class(or 2D Bravais lattice type) that is anchored to the least broken symmetries are identified as genuine in the presence of generalized noise. More severely broken symmetries that are not anchored to the least broken symmetries are identified as pseudo-symmetries. Our point symmetry quantification study of an electron diffraction spot pattern is highly topical because a new contrast mechanism for 4D scanning transmission electron microscopy was recently demonstrated by other authors. The usage of objective symmetry quantifications is bound to become the preeminent condition of the establishment of that contrast mode as an industry-wide standard.

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preprint2020arXiv

Clarifying multiple-tip effects on Scanning Tunneling Microscopy imaging of 2D periodic objects and crystallographic averaging in the spatial frequency domain

Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning tunneling microscopy (STM) and requires images from a sample that is periodic in two dimensions. The image-forming current for multiple tips in STM is derived in a more straightforward manner than prior approaches. The Fourier spectrum of the current for p4mm Bloch surface wave functions and a pair of delta function tips reveals the tip-separation dependence of various types of image obscurations. In particular our analyses predict that quantum interference should be visible on a macroscopic scale in the form of bands quite distinct from the basket-weave patterns a purely classical model would create at the same periodic double STM tip separations. A surface wave function that models the essential character of highly (0001) oriented pyrolytic graphite (technically known as HOPG) is introduced and used for a similar tip-separation analysis. Using a bonding H_2 tip wave function with significant spatial extent instead of this pair of infinitesimal Dirac delta function tips does not affect these outcomes in any observable way. This is explained by Pierre Curie's well known symmetry principle. Classical simulations of multiple tip effects in STM images may be understood as modeling multiple tip effects in images that were recorded with other types of SPMs). Our analysis clarifies why CIP and crystallographic averaging work well in removing the effects of a blunt SPM tip (that consist of multiple mini-tips) from the recorded 2D periodic images and also outlines the limitations of this image processing techniques for certain spatial separations of STM mini-tips.

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preprint2019arXiv

3D printing in the context of Science, Technology, Engineering, and Mathematics education at the college/university level

An overview concerning 3D printing (a.k.a. additive manufacturing) within the context of Science, Technology, Engineering, and Mathematics (STEM) education at the college/university level is provided. The vast majority of quoted papers report self-made models for which faculty members and their students have created the necessary 3D print files themselves by various routes. The prediction by the Gartner consulting company that it will take more than ten years from July 2014 onwards for Classroom 3D Printing to reach its Plateau of Productivity in one of their hallmark Visibility versus Time (Hype Cycle) graphs is critically assessed. The bibliography of this book chapter sums up the state-of-the art in 3D printing for STEM (including nano-science and nano-engineering) education at the college level approximately four years after Gartner's prediction. Current methodologies and best practices of college-level Classroom 3D printing are described in the main section of this review. Detailed information is given mainly for those papers in which the authors of this book chapter are authors and co-authors. A straightforward route from crystallographic information framework files (CIFs) at a very large open-access database to 3D print files for atomic-level crystal and molecule structure models is described here in some detail. Because the development of methodologies and best practices are typical activities of the penultimate stage of a Hype Cycle, we conclude that (i) Gartner's prediction underestimates the creativity, resourcefulness, and commitment of college educators to their students and that (ii) Classroom 3D Printing will be a widespread reality significantly earlier than the middle of the next decade (at least in the USA as more than one half of the relevant/quoted papers originated there). An appendix provides a brief technical review of contemporary 3D printing techniques.

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preprint2005arXiv

Making sense of nanocrystal lattice fringes

The orientation-dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of 3D crystallographic information in lattice images. In particular, these maps can help researchers to determine the 3D lattice parameters of individual nano-crystals, to ``fringe fingerprint'' collections of randomly-oriented particles, and to measure local specimen-thickness with only modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help from more precise goniometers) will be more useful as aberration-correction moves resolutions into the subangstrom range.

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