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Peilong Feng

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Emerging Technologies eess.SY Systems and Control

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preprint2022arXiv

A CMOS-based Characterisation Platform for Emerging RRAM Technologies

Mass characterisation of emerging memory devices is an essential step in modelling their behaviour for integration within a standard design flow for existing integrated circuit designers. This work develops a novel characterisation platform for emerging resistive devices with a capacity of up to 1 million devices on-chip. Split into four independent sub-arrays, it contains on-chip column-parallel DACs for fast voltage programming of the DUT. On-chip readout circuits with ADCs are also available for fast read operations covering 5-decades of input current (20nA to 2mA). This allows a device's resistance range to be between 1k $Ω$ and 10M $Ω$ with a minimum voltage range of $\pm$ 1.5V on the device.

preprint2022arXiv

An Open-Source RRAM Compiler

Memory compilers are necessary tools to boost the design procedure of digital circuits. However, only a few are available to academia. Resistive Random Access Memory (RRAM) is characterised by high density, high speed, non volatility and is a potential candidate of future digital memories. To the best of the authors' knowledge, this paper presents the first open source RRAM compiler for automatic memory generation including its peripheral circuits, verification and timing characterisation. The RRAM compiler is written with Cadence SKILL programming language and is integrated in Cadence environment. The layout verification procedure takes place in Siemens Mentor Calibre tool. The technology used by the compiler is TSMC 180nm. This paper analyses the novel results of a plethora of M x N RRAMs generated by the compiler, up to M = 128, N = 64 and word size B = 16 bits, for clock frequency equal to 12.5 MHz. Finally, the compiler achieves density of up to 0.024 Mb/mm2.

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