Source author record

Pavol Juhas

Pavol Juhas appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

cond-mat.mtrl-sci cond-mat.mes-hall Human-Computer Interaction physics.data-an

Catalog footprint

What is connected

7works

4topics

4close collaborators

Actions

Connect this record

Open graph Browse works

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

preprint2020arXiv

sasPDF: pair distribution function analysis of nanoparticle assemblies from small-angle-scattering data

We extends pair distribution function (PDF) analysis into the small-angle scattering (SAS) regime and describe the data collection protocol for optimum data quality. We also present the PDFgetS3 software package that can be readily used to extract the PDF from small-angle scattering data. We then apply the sasPDF method to investigate structures of some representative nanoparticle assemblies (NPA) samples with different levels of structural order.

preprint2015arXiv

xPDFsuite: an end-to-end software solution for high throughput pair distribution function transformation, visualization and analysis

The xPDFsuite software program is described. It is for processing and analyzing atomic pair distribution functions (PDF) from X-ray powder diffraction data. It provides a convenient GUI for SrXplanr and PDFgetX3, allowing the users to easily obtain 1D diffraction pattern from raw 2D diffraction images and then transform them to PDFs. It also bundles PDFgui which allows the users to create structure models and fit to the experiment data. It is specially useful for working with large numbers of datasets such as from high throughout measurements. Some of the key features are: real time PDF transformation and plotting; 2D waterfall, false color heatmap, and 3D contour plotting for multiple datasets; static and dynamic mask editing; geometric calibration of powder diffraction image; configurations and project saving and loading; Pearson correlation analysis on selected datasets; written in Python and support multiple platforms.

preprint2014arXiv

On the estimation of statistical uncertainties on powder diffraction and small angle scattering data from 2-D x-ray detectors

This paper explores optimal methods for obtaining one-dimensional (1D) powder pattern intensities from two-dimensional (2D) planar detectors with good estimates of their standard deviations. We describe methods to estimate uncertainties when the same image is measured in multiple frames as well as from a single frame. We show the importance of considering the correlation of diffraction points during the integration and the re-sampling process of data analysis. We find that correlations between adjacent pixels in the image can lead to seriously overestimated uncertainties if it is neglected in the integration process. Off-diagonal entries in the variance-covariance (VC) matrix are problematic as virtually all data processing and modeling programs cannot handle the full VC matrix. We show the off-diagonal terms come mainly from the pixel splitting algorithm used as the default integration algorithm in many popular 2D integration programs, as well as from re-binning and re-sampling steps later in the processing. When the full VC matrix can be propagated during the data reduction, it is possible to get accurate refined parameters and their uncertainties at the cost of increasing computational complexity. However, as this is not normally possible, we explore the best approximate methods for data processing in order to estimate uncertainties on refined parameters with the greatest accuracy from just the diagonal variance terms in the VC matrix.

preprint2012arXiv

PDFgetX3: A rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions

PDFgetX3 is a new software application for converting X-ray powder diffraction data to atomic pair distribution function (PDF). PDFgetX3 has been designed for ease of use, speed and automated operation. The software can readily process hundreds of X-ray patterns within few seconds and is thus useful for high-throughput PDF studies, that measure numerous datasets as a function of time, temperature or other environment parameters. In comparison to the preceding programs, PDFgetX3 requires fewer inputs, less user experience and can be readily adopted by novice users. The live-plotting interactive feature allows to assess the effects of calculation parameters and select their optimum values. PDFgetX3 uses an ad-hoc data correction method, where the slowly-changing structure independent signal is filtered out to obtain coherent X-ray intensities that contain structure information. The outputs from PDFgetX3 have been verified by processing experimental PDFs from inorganic, organic and nanosized samples and comparing them to their counterparts from previous established software. In spite of different algorithm, the obtained PDFs were nearly identical and yielded highly similar results when used in structure refinement. PDFgetX3 is written in Python language and features well documented, reusable codebase. The software can be used either as standalone application or as a library of PDF-processing functions that can be called on from other Python scripts. The software is free for open academic research, but requires paid license for commercial use.

preprint2012arXiv

Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron-derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

preprint2011arXiv

The Nyquist-Shannon sampling theorem and the atomic pair distribution function

We have systematically studied the optimal real-space sampling of atomic pair distribution data by comparing refinement results from oversampled and resampled data. Based on nickel and a complex perovskite system, we demonstrate that the optimal sampling is bounded by the Nyquist interval described by the Nyquist-Shannon sampling theorem. Near this sampling interval, the data points in the PDF are minimally correlated, which results in more reliable uncertainty prediction. Furthermore, refinements using sparsely sampled data may run many times faster than using oversampled data. This investigation establishes a theoretically sound limit on the amount of information contained in the PDF, which has ramifications towards how PDF data are modeled.

preprint2010arXiv

Crystal structure solution from experimentally determined atomic pair distribution functions

The paper describes an extension of the Liga algorithm for structure solution from atomic pair distribution function (PDF), to handle periodic crystal structures with multiple elements in the unit cell. The procedure is performed in 2 separate steps - at first the Liga algorithm is used to find unit cell sites consistent with pair distances extracted from the experimental PDF. In the second step the assignment of atom species over cell sites is solved by minimizing the overlap of their empirical atomic radii. The procedure has been demonstrated on synchrotron x-ray PDF data from 16 test samples. The structure solution was successful for 14 samples including cases with enlarged super cells. The algorithm success rate and the reasons for failed cases are discussed together with enhancements that should improve its convergence and usability.