Researcher profile

Pablo Villanueva-Perez

Pablo Villanueva-Perez contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

ONIX: an X-ray deep-learning tool for 3D reconstructions from sparse views

Three-dimensional (3D) X-ray imaging techniques like tomography and confocal microscopy are crucial for academic and industrial applications. These approaches access 3D information by scanning the sample with respect to the X-ray source. However, the scanning process limits the temporal resolution when studying dynamics and is not feasible for some applications, such as surgical guidance in medical applications. Alternatives to obtaining 3D information when scanning is not possible are X-ray stereoscopy and multi-projection imaging. However, these approaches suffer from limited volumetric information as they only acquire a small number of views or projections compared to traditional 3D scanning techniques. Here, we present ONIX (Optimized Neural Implicit X-ray imaging), a deep-learning algorithm capable of retrieving 3D objects with arbitrary large resolution from only a set of sparse projections. ONIX, although it does not have access to any volumetric information, outperforms current 3D reconstruction approaches because it includes the physics of image formation with X-rays, and it generalizes across different experiments over similar samples to overcome the limited volumetric information provided by sparse views. We demonstrate the capabilities of ONIX compared to state-of-the-art tomographic reconstruction algorithms by applying it to simulated and experimental datasets, where a maximum of eight projections are acquired. We anticipate that ONIX will become a crucial tool for the X-ray community by i) enabling the study of fast dynamics not possible today when implemented together with X-ray multi-projection imaging, and ii) enhancing the volumetric information and capabilities of X-ray stereoscopic imaging in medical applications.

preprint2020arXiv

Ptychographic X-ray Speckle Tracking with Multi Layer Laue Lens Systems

The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical sensitivity. The penetrating power that makes x-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques that have enabled the fabrication of a series of highly focusing x-ray lenses, known as wedged multi layer Laue lenses. Improvements to the lens design and fabrication technique demands an accurate, robust, in-situ and at-wavelength characterisation method. To this end, we have developed a modified form of the speckle-tracking wavefront metrology method, the ptychographic x-ray speckle tracking method, which is capable of operating with highly divergent wavefields. A useful by-product of this method, is that it also provides high-resolution and aberration-free projection images of extended specimens. We report on three separate experiments using this method, where we have resolved ray path angles to within 4 nano-radians with an imaging resolution of 45nm (full-period). This method does not require a high degree of coherence, making it suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology.