Researcher profile

O. Götberg

O. Götberg contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2022arXiv

Accessing the spin structure of buried electronic states

In spin- and angle-resolved photoemission spectroscopy (SARPES) the energy-momentum dispersion of electronic states in crystalline solids is measured along with the spin direction of the photoemitted electrons. The technique therefore allows for mapping out a material's band structure in a spin resolved fashion. By conducting SARPES measurements using low-energy photons, the spin sensitivity of the technique can be combined an increased bulk probe depth, provided by the large electron inelastic mean-free path at these kinetic energies, to directly access the spin structure of electronic states at buried interfaces. Here, we demonstrate this capability by using SARPES to determine the spin polarization of photoelectrons emitted from a 6-nm-thick film of the topological insulator Bi$_2$Se$_3$ using photons with an energy of 8.5 eV. By modelling the expected spin structure in the film, we show that the complex spin polarization that is observed is the integrated spin signal from spin-polarized states at the surface, bulk and buried interface (bottom surface) of the topological-insulator film. Our results therefore allows us to directly determine the spin texture of the buried Dirac interface state. This capability is highly attractive for state-of-the art spectroscopic measurements of the spin-physics at play in quantum-material based or spintronic devices where spin-polarized interface states define the operational principle of the devices.

preprint2013arXiv

Direct observation of decoupled Dirac states at the interface between topological and normal insulators

Several proposed applications and exotic effects in topological insulators rely on the presence of helical Dirac states at the interface between a topological and a normal insulator. In the present work, we have used low-energy angle-resolved photoelectron spectroscopy to uncover and characterize the interface states of Bi$_2$Se$_3$ thin films and Bi$_2$Te$_3$/Bi$_2$Se$_3$ heterostuctures grown on Si(111). The results establish that Dirac fermions are indeed present at the topological-normal-insulator boundary and absent at the topological-topological-insulator interface. Moreover, it is demonstrated that band bending present within the topological-insulator films leads to a substantial separation of the interface and surface states in energy. These results pave the way for further studies and the realization of interface-related phenomena in topological-insulator thin-film heterostructures.

preprint2011arXiv

An experimental setup for high resolution 10.5 eV laser-based angle-resolved photoelectron spectroscopy using a time-of-flight electron analyzer

We present an experimental setup for laser-based angle-resolved time-of-flight (LARTOF) photoemission. Using a picosecond pulsed laser, photons of energy 10.5 eV are generated through higher harmonic generation in xenon. The high repetition rate of the light source, variable between 0.2-8 MHz, enables high photoelectron count rates and short acquisition times. By using a Time-of-Flight (ToF) analyzer with angle-resolving capabilities electrons emitted from the sample within a circular cone of up to \pm15 degrees can be collected. Hence, simultaneous acquisition of photoemission data for a complete area of the Brillouin zone is possible. The current photon energy enables bulk sensitive measurements, high angular resolution and the resulting covered momentum space is large enough to enclose the entire Brillouin zone in cuprate high-Tc superconductors. Fermi edge measurements on polycrystalline Au shows an energy resolution better than 5 meV. Data from a test measurement of the Au(111) surface state is presented along with measurements of the Fermi surface of the high-Tc superconductor Bi2212.