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Source author record

Nathan P. Guisinger

Nathan P. Guisinger appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mes-hallcond-mat.mtrl-sci

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Published work

5 published item(s)

preprint2016arXiv

Large spatially-resolved rectification in a donor-acceptor molecular heterojunction

We demonstrate that rectification ratios (RR) of >250 (>1000) at biases of 0.5 V (1.2 V) are achievable at the two-molecule limit for donor-acceptor bilayers of pentacene on fullerene on Cu using scanning tunneling spectroscopy and microscopy. Using first-principles calculations, we show that the system behaves as a molecular Schottky diode with a tunneling transport mechanism from semiconducting pentacene to Cu-hybridized metallic fullerene. Low-bias RRs vary by two orders-of-magnitude at the edge of these molecular heterojunctions due to increased Stark shifts and confinement effects.

0 citations0 reviewsNo code linkedOpen access
preprint2012arXiv

Graphene Induced Surface Reconstruction of Cu

An atomic-scale study utilizing scanning tunneling microscopy (STM) in ultrahigh vacuum (UHV) is performed on large single crystalline graphene grains synthesized on Cu foil by a chemical vapor deposition (CVD) method. After thermal annealing, we observe the presence of periodic surface depressions (stripe patterns) that exhibit long-range order formed in the area of Cu covered by graphene. We suggest that the observed stripe pattern is a Cu surface reconstruction formed by partial dislocations (which appeared to be stair-rod-like) resulting from the strain induced by the graphene overlayer. In addition, these graphene grains are shown to be more decoupled from the Cu substrate compared to previously studied grains that exhibited Moiré patterns.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Grain Boundary Loops in Graphene

Topological defects can affect the physical properties of graphene in unexpected ways. Harnessing their influence may lead to enhanced control of both material strength and electrical properties. Here we present a new class of topological defects in graphene composed of a rotating sequence of dislocations that close on themselves, forming grain boundary loops that either conserve the number of atoms in the hexagonal lattice or accommodate vacancy/interstitial reconstruction, while leaving no unsatisfied bonds. One grain boundary loop is observed as a "flower" pattern in scanning tunneling microscopy (STM) studies of epitaxial graphene grown on SiC(0001). We show that the flower defect has the lowest energy per dislocation core of any known topological defect in graphene, providing a natural explanation for its growth via the coalescence of mobile dislocations.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

A survey of fractured SrTiO$_3$ surfaces: from the micro-meter to nano-meter scale

Cross-sectional scanning tunneling microscopy was utilized to study fractured perovskie oxide surfaces. It was found for the non-cleavable perovskite oxide, SrTiO$_{3}$, that atomically flat terraces could be routinely created with a controlled fracturing procedure. Optical and scanning electron microscopy as well as a profilometer were used to obtain the information from sub-millimeter to sub-micrometer scales of the fractured surface topography.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Visualizing nanoscale electronic band alignment at the La$_{2/3}$Ca$_{1/3}$MnO$_{3}$/Nb:SrTiO$_{3}$ interface

Cross-sectional scanning tunnelling microscopy and spectroscopy (XSTM/S) were used to map out the band alignment across the complex oxide interface of La$_{2/3}$Ca$_{1/3}$MnO$_{3}$/Nb-doped SrTiO$_{3}$. By a controlled cross-sectional fracturing procedure, unit-cell high steps persist near the interface between the thin film and the substrate in the non-cleavable perovskite materials. The abrupt changes of the mechanical and electronic properties were visualized directly by XSTM/S. Using changes in the DOS as probe by STM, the electronic band alignment across the heterointerface was mapped out providing a new approach to directly measure the electronic properties at complex oxide interfaces.

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