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Naixing Wang

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Published work

2 published item(s)

preprint2022arXiv

DeepGate: Learning Neural Representations of Logic Gates

Applying deep learning (DL) techniques in the electronic design automation (EDA) field has become a trending topic. Most solutions apply well-developed DL models to solve specific EDA problems. While demonstrating promising results, they require careful model tuning for every problem. The fundamental question on "How to obtain a general and effective neural representation of circuits?" has not been answered yet. In this work, we take the first step towards solving this problem. We propose DeepGate, a novel representation learning solution that effectively embeds both logic function and structural information of a circuit as vectors on each gate. Specifically, we propose transforming circuits into unified and-inverter graph format for learning and using signal probabilities as the supervision task in DeepGate. We then introduce a novel graph neural network that uses strong inductive biases in practical circuits as learning priors for signal probability prediction. Our experimental results show the efficacy and generalization capability of DeepGate.

preprint2022arXiv

DeepTPI: Test Point Insertion with Deep Reinforcement Learning

Test point insertion (TPI) is a widely used technique for testability enhancement, especially for logic built-in self-test (LBIST) due to its relatively low fault coverage. In this paper, we propose a novel TPI approach based on deep reinforcement learning (DRL), named DeepTPI. Unlike previous learning-based solutions that formulate the TPI task as a supervised-learning problem, we train a novel DRL agent, instantiated as the combination of a graph neural network (GNN) and a Deep Q-Learning network (DQN), to maximize the test coverage improvement. Specifically, we model circuits as directed graphs and design a graph-based value network to estimate the action values for inserting different test points. The policy of the DRL agent is defined as selecting the action with the maximum value. Moreover, we apply the general node embeddings from a pre-trained model to enhance node features, and propose a dedicated testability-aware attention mechanism for the value network. Experimental results on circuits with various scales show that DeepTPI significantly improves test coverage compared to the commercial DFT tool. The code of this work is available at https://github.com/cure-lab/DeepTPI.