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N. Venkataramani

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Published work

6 published item(s)

preprint2015arXiv

Electrical properties of RF sputtered PMN-PT thin films on LCMO buffered platinized glass substrate

Lead based relaxor ferroelectric thin films have been of technological importance due to excellent properties for several commercial applications. However subtleness and high cost of fabrication have plagued of these materials. In this work a systematic study of PMN-PT thin films grown on LCMO buffered platinized glass substrates has been undertaken. The films were grown at room temperature using RF magnetron sputtering. Single phase PMN-PT films could be obtained by exsitu thermal annealing in air for 2h at temperatures 550 and 650 degree C. The films annealed at temperatures lower than 550 degree C and films without buffer layer showed presence of pyrochlore. Effect of annealing temperature on the microstructure, dielectric and ferroelectric properties of the PMN-PT films has been investigated. Scanning electron micrographs of single phase PMN-PT films show a bimodal grain size distribution for films annealed at 550 and 650 degree C. A high dielectric constant of 1300 and a remnant polarization (2Pr) of 17micro C/cm2 were observed for film annealed at 650 degree C.

preprint2014arXiv

Study of strong photon-magnon coupling in a YIG-film split-ring resonant system

By using the stripline Microwave Vector Network Analyzer Ferromagnetic Resonance and Pulsed Inductive Microwave Magnetometry spectroscopy techniques, we study a strong coupling regime of magnons to microwave photons in the planar geometry of a lithographically formed split-ring resonator (SRR) loaded by a single-crystal epitaxial yttrium-iron garnet (YIG) film. Strong anti-crossing of the photon modes of SRR and of the magnon modes of the YIG film is observed in the applied-magnetic-field resolved measurements. The coupling strength extracted from the experimental data reaches 9 percent at 3 GHz. Theoretically, we propose an equivalent circuit model of an SRR loaded by a magnetic film. This model follows from the results of our numerical simulations of the microwave field structure of the SRR and of the magnetization dynamics in the YIG film driven by the microwave currents in the SRR. The equivalent circuit model is in good agreement with the experiment. It provides a simple physical explanation of the process of mode anti-crossing. Our findings are important for future applications in microwave quantum photonic devices as well as in magnetically tunable metamaterials exploiting the strong coupling of magnons to microwave photons.

preprint2010arXiv

Superparamagnetism in Nanocrystalline Copper Ferrite Thin Films

The rf sputtered copper ferrite films contain nanocrystalline grains. In these films, the magnetization does not saturate even in high magnetic fields. This phenomenon of high field susceptibility is attributed to the defects and/or superparamagnetic grains in the films. A simple model is developed to describe the observed high field magnetization behavior of these films. The model is found to fit well to the high field part for all the studied films. An attempt is also made to explain the temperature variation of the ferrimagnetic contribution on the basis of reported exchange constants.

preprint2010arXiv

Temperature dependence of Magnetic properties in Nanocrystalline copper ferrite thin films

The copper ferrite thin films have been deposited by RF sputtering at a 50W rf power. The As-deposited films are annealed in air at $800^{\circ}$C and then slow cooled. The As-deposited (AD) as well as slow cooled (SC) films are studied using a SQUID Magnetometer. The M Vs H curves have been recorded at various temperatures between 5K to 300K. The coercivities obtained from the MH curves are then plotted against temperature (T). The magnetization in the films does not saturate, even at the highest field of 7T. The high field part of the M Vs H curves is fitted using the H1/2 term of Chikazumi expression M(H)= Q*(1- a /Hn), with n=1/2. The variation of coefficient 'a' of H1/2 term has been observed with temperature (T). An attempt has been made to correlate this with the coercivity (Hc) in the case of annealed films.

preprint2010arXiv

The High Field Magnetization in the RF Sputter Deposited Copper Ferrite Thin Films

Copper ferrite thin films were deposited on amorphous quartz substrates. The as deposited films were annealed in air and either quenched or slow cooled. Magnetization studies were carried out on the as deposited as well as annealed films using a SQUID magnetometer. The M-H curves were measured up to a field of 7T, at temperatures varying from 5K to 300K. The magnetization in the films did not saturate, even at the highest field. The expression, M(H)= Q(1- a/H^n) fitted the approach to saturation best with n=1/2, for all films and at all temperatures. The coefficient a was the highest for the as deposited film and was the smallest for the quenched film. In the case of as deposited film, the value of coefficient a increased with increasing temperature, while for the annealed films, the value of a showed a decrease as temperature increases.

preprint2010arXiv

Transmission Electron Microscopy Studies on RF Sputtered Copper Ferrite Thin Films

Copper ferrite thin films were rf sputtered at a power of 50W. The as deposited films were annealed in air at 800°C and slow cooled. The transmission electron microscope (TEM) studies were carried out on as deposited as well as on slow cooled film. Significantly larger defect concentration, including stacking faults, was observed in 50W as deposited films than the films deposited at a higher rf power of 200W. The film annealed at 800°C and then slow cooled showed an unusual grain growth upto 180nm for a film thickness of ~240nm. These grains showed Kikuchi pattern.