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N. Do

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2 published item(s)

preprint2016arXiv

Temperature-Insensitive Analog Vector-by-Matrix Multiplier Based on 55 nm NOR Flash Memory Cells

We have fabricated and successfully tested an analog vector-by-matrix multiplier, based on redesigned 10x12 arrays of 55 nm commercial NOR flash memory cells. The modified arrays enable high-precision individual analog tuning of each cell, with sub-1% accuracy, while keeping the highly optimized cells, with their long-term state retention, intact. The array has an area of 0.33 um^2 per cell, and is at least one order of magnitude more dense than the reported prior implementations of nonvolatile analog memories. The demonstrated vector-by-vector multiplier, using gate coupling to additional periphery cells, has ~2% precision, limited by the aggregate effect of cell noise, retention, mismatch, process variations, tuning precision, and capacitive crosstalk. A differential version of the multiplier has allowed us to demonstrate sub-3% temperature drift of the output signal in the range between 25C and 85C.

preprint2014arXiv

Redesigning Commercial Floating-Gate Memory for Analog Computing Applications

We have modified a commercial NOR flash memory array to enable high-precision tuning of individual floating-gate cells for analog computing applications. The modified array area per cell in a 180 nm process is about 1.5 um^2. While this area is approximately twice the original cell size, it is still at least an order of magnitude smaller than in the state-of-the-art analog circuit implementations. The new memory cell arrays have been successfully tested, in particular confirming that each cell may be automatically tuned, with ~1% precision, to any desired subthreshold readout current value within an almost three-orders-of-magnitude dynamic range, even using an unoptimized tuning algorithm. Preliminary results for a four-quadrant vector-by-matrix multiplier, implemented with the modified memory array gate-coupled with additional peripheral floating-gate transistors, show highly linear transfer characteristics over a broad range of input currents.