Researcher profile

Muhammad Rezaul Karim

Muhammad Rezaul Karim contributes to research discovery and scholarly infrastructure.

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Published work

6 published item(s)

preprint2010arXiv

Building Toffoli Network for Reversible Logic Synthesis Based on Swapping Bit Strings

In this paper, we have implemented and designed a sorting network for reversible logic circuits synthesis in terms of n*n Toffoli gates. The algorithm presented in this paper constructs a Toffoli Network based on swapping bit strings. Reduction rules are then applied by simple template matching and removing useless gates from the network. Random selection of bit strings and reduction of control inputs are used to minimize both the number of gates and gate width. The method produces near optimal results for up to 3-input 3-output circuits.

preprint2010arXiv

Efficient Wrapper/TAM Co-Optimization for SOC Using Rectangle Packing

The testing time for a system-on-chip(SOC) largely depends on the design of test wrappers and the test access mechanism(TAM).Wrapper/TAM co-optimization is therefore necessary to minimize SOC testing time . In this paper, we propose an efficient algorithm to construct wrappers that reduce testing time for cores. We further propose a new approach for wrapper/TAM co-optimization based on two-dimensional rectangle packing. This approach considers the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time.

preprint2010arXiv

Sorting Network for Reversible Logic Synthesis

In this paper, we have introduced an algorithm to implement a sorting network for reversible logic synthesis based on swapping bit strings. The algorithm first constructs a network in terms of n*n Toffoli gates read from left to right. The number of gates in the circuit produced by our algorithm is then reduced by template matching and removing useless gates from the network. We have also compared the efficiency of the proposed method with the existing ones.

preprint2010arXiv

Variable Block Carry Skip Logic using Reversible Gates

Reversible circuits have applications in digital signal processing, computer graphics, quantum computation and cryptography. In this paper, a generalized k*k reversible gate family is proposed and a 3*3 gate of the family is discussed. Inverter, AND, OR, NAND, NOR, and EXOR gates can be realized by this gate. Implementation of a full-adder circuit using two such 3*3 gates is given. This full-adder circuit contains only two reversible gates and produces no extra garbage outputs. The proposed full-adder circuit is efficient in terms of gate count, garbage outputs and quantum cost. A 4-bit carry skip adder is designed using this full-adder circuit and a variable block carry skip adder is discussed. Necessary equations required to evaluate these adder are presented.

preprint2010arXiv

Wrapper/TAM Co-Optimization and constrained Test Scheduling for SOCs Using Rectangle Bin Packing

This paper describes an integrated framework for SOC test automation. This framework is based on a new approach for Wrapper/TAM co-optimization based on rectangle packing considering the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time .In this paper, an efficient algorithm has been proposed to construct wrappers that reduce testing time for cores. Rectangle packing has been used to develop an integrated scheduling algorithm that incorporates power constraints in the test schedule. The test power consumption is important to consider since exceeding the system's power limit might damage the system.

preprint2010arXiv

Wrapper/TAM Co-Optimization and Test Scheduling for SOCs Using Rectangle Bin Packing Considering Diagonal Length of Rectangles

This paper describes an integrated framework for SOC test automation. This framework is based on a new approach for Wrapper/TAM co-optimization based on rectangle packing considering the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time. In this paper, we propose an efficient algorithm to construct wrappers that reduce testing time for cores. We then use rectangle packing to develop an integrated scheduling algorithm that incorporates power constraints in the test schedule. The test power consumption is important to consider since exceeding the system's power limit might damage the system.