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Researcher profile

Hafiz Md. Hasan Babu

Hafiz Md. Hasan Babu contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Other Computer ScienceHardware Architecture

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Published work

5 published item(s)

preprint2022arXiv

A Cost-Efficient Look-Up Table Based Binary Coded Decimal Adder Design

The BCD (Binary Coded Decimal) being the more accurate and human-readable representation with ease of conversion, is prevailing in the computing and electronic communication.In this paper, a tree-structured parallel BCD addition algorithm is proposed with the reduced time complexity. BCD adder is more effective with a LUT (Look-Up Table)-based design, due to FPGA (Field Programmable Gate Array) technology's enumerable benefits and applications. A size-minimal and depth-minimal LUT-based BCD adder circuit construction is the main contribution of this paper.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Efficient Wrapper/TAM Co-Optimization for SOC Using Rectangle Packing

The testing time for a system-on-chip(SOC) largely depends on the design of test wrappers and the test access mechanism(TAM).Wrapper/TAM co-optimization is therefore necessary to minimize SOC testing time . In this paper, we propose an efficient algorithm to construct wrappers that reduce testing time for cores. We further propose a new approach for wrapper/TAM co-optimization based on two-dimensional rectangle packing. This approach considers the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Variable Block Carry Skip Logic using Reversible Gates

Reversible circuits have applications in digital signal processing, computer graphics, quantum computation and cryptography. In this paper, a generalized k*k reversible gate family is proposed and a 3*3 gate of the family is discussed. Inverter, AND, OR, NAND, NOR, and EXOR gates can be realized by this gate. Implementation of a full-adder circuit using two such 3*3 gates is given. This full-adder circuit contains only two reversible gates and produces no extra garbage outputs. The proposed full-adder circuit is efficient in terms of gate count, garbage outputs and quantum cost. A 4-bit carry skip adder is designed using this full-adder circuit and a variable block carry skip adder is discussed. Necessary equations required to evaluate these adder are presented.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Wrapper/TAM Co-Optimization and constrained Test Scheduling for SOCs Using Rectangle Bin Packing

This paper describes an integrated framework for SOC test automation. This framework is based on a new approach for Wrapper/TAM co-optimization based on rectangle packing considering the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time .In this paper, an efficient algorithm has been proposed to construct wrappers that reduce testing time for cores. Rectangle packing has been used to develop an integrated scheduling algorithm that incorporates power constraints in the test schedule. The test power consumption is important to consider since exceeding the system's power limit might damage the system.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Wrapper/TAM Co-Optimization and Test Scheduling for SOCs Using Rectangle Bin Packing Considering Diagonal Length of Rectangles

This paper describes an integrated framework for SOC test automation. This framework is based on a new approach for Wrapper/TAM co-optimization based on rectangle packing considering the diagonal length of the rectangles to emphasize on both TAM widths required by a core and its corresponding testing time. In this paper, we propose an efficient algorithm to construct wrappers that reduce testing time for cores. We then use rectangle packing to develop an integrated scheduling algorithm that incorporates power constraints in the test schedule. The test power consumption is important to consider since exceeding the system's power limit might damage the system.

0 citations0 reviewsNo code linkedOpen access