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Minoru Kuribayashi

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Information Theory Machine Learning math.IT

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preprint2019arXiv

Detecting and Correcting Adversarial Images Using Image Processing Operations

Deep neural networks (DNNs) have achieved excellent performance on several tasks and have been widely applied in both academia and industry. However, DNNs are vulnerable to adversarial machine learning attacks, in which noise is added to the input to change the network output. We have devised an image-processing-based method to detect adversarial images based on our observation that adversarial noise is reduced after applying these operations while the normal images almost remain unaffected. In addition to detection, this method can be used to restore the adversarial images' original labels, which is crucial to restoring the normal functionalities of DNN-based systems. Testing using an adversarial machine learning database we created for generating several types of attack using images from the ImageNet Large Scale Visual Recognition Challenge database demonstrated the efficiency of our proposed method for both detection and correction.

preprint2018arXiv

Efficient (nonrandom) construction and decoding for non-adaptive group testing

The task of non-adaptive group testing is to identify up to $d$ defective items from $N$ items, where a test is positive if it contains at least one defective item, and negative otherwise. If there are $t$ tests, they can be represented as a $t \times N$ measurement matrix. We have answered the question of whether there exists a scheme such that a larger measurement matrix, built from a given $t\times N$ measurement matrix, can be used to identify up to $d$ defective items in time $O(t \log_2{N})$. In the meantime, a $t \times N$ nonrandom measurement matrix with $t = O \left(\frac{d^2 \log_2^2{N}}{(\log_2(d\log_2{N}) - \log_2{\log_2(d\log_2{N})})^2} \right)$ can be obtained to identify up to $d$ defective items in time $\mathrm{poly}(t)$. This is much better than the best well-known bound, $t = O \left( d^2 \log_2^2{N} \right)$. For the special case $d = 2$, there exists an efficient nonrandom construction in which at most two defective items can be identified in time $4\log_2^2{N}$ using $t = 4\log_2^2{N}$ tests. Numerical results show that our proposed scheme is more practical than existing ones, and experimental results confirm our theoretical analysis. In particular, up to $2^{7} = 128$ defective items can be identified in less than $16$s even for $N = 2^{100}$.