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Mark Hayward

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Published work

2 published item(s)

preprint2020arXiv

An analysis of carrier dynamics in methylammonium lead triiodide perovskite solar cells using cross-correlation noise spectroscopy

Using cross-correlation current noise spectroscopy, we have investigated carrier dynamics in methylammonium lead triiodide solar cells. This method provides a space selectivity for devices with planar multi-layered structure, effectively amplifying current noise contributions coming from the most resistive element of the stack. In the studied solar cells, we observe near full-scale shot noise, indicating the dominance of noise generation by a single source, likely the interface between the perovskite and the spiro-OMeTAD hole-transport layer. We argue that the strong 1/f noise term has contributions both from the perovskite layer and interfaces. It displays non-ideal dependence on photocurrent, $S \propto I^{1.4}$ (instead of usual $S \propto I^2$ ), which is likely due to current-induced halide migration. Finally, we observe generation-recombination noise. The relaxation time of this process grows linearly with photocurrent, which allows to attribute this contribution to bimolecular recombination in the perovskite bulk absorption layer. Extrapolating our results, we estimate that at the standard 1 sun illumination the electron-hole recombination time is 5 microseconds.

preprint2020arXiv

Silicon heterojunction solar cells explored via noise spectroscopy: spatial selectivity and the influence of a-Si passivating layers

We have employed state-of-the-art cross-correlation noise spectroscopy to study carrier dynamics in silicon heterojunction solar cells, complimented by SENTARUS simulations of the same devices. These cells were composed of a light absorbing n-doped crystalline silicon layer contacted by passivating layers of i-a-Si:H and doped a-Si:H electrode layers. The method provided a two-orders-of-magnitude improved sensitivity and allowed to resolution of three additional contributions to noise in addition to 1/f noise. We have observed shot noise with Fano factor close to unity. We have also observed a peculiar generation-recombination term, which presents only under light illumination with energy above 2 eV and thus reflects light absorption and carrier trapping in the a-Si:H layers. A second, low-frequency generation-recombination term was detected at temperatures below 100 K. We argue that it appears because the process of charge carrier transfer across i-a-Si:H occurs via an intermediate defect limited by tunneling above about 100 K and a thermally assisted process below this temperature. We also discuss the spatial selectivity of noise spectroscopy, namely the tendency of the method to amplify noise contributions from the most resistive element of the cell. Indeed, in our case, all three terms are linked to the passivating i-a-Si:H layer.