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Marie-Maxime Mennemanteuil

Marie-Maxime Mennemanteuil appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2015arXiv

Spontaneous hot-electron light emission from electron-fed optical antennas

Nanoscale electronics and photonics are among the most promising research areas providing functional nano-components for data transfer and signal processing. By adopting metal-based optical antennas as a disruptive technological vehicle, we demonstrate that these two device-generating technologies can be interfaced to create an electronically-driven self-emitting unit. This nanoscale plasmonic transmitter operates by injecting electrons in a contacted tunneling antenna feedgap. Under certain operating conditions, we show that the antenna enters a highly nonlinear regime in which the energy of the emitted photons exceeds the quantum limit imposed by the applied bias. We propose a model based upon the spontaneous emission of hot electrons that correctly reproduces the experimental findings. The electron-fed optical antennas described here are critical devices for interfacing electrons and photons, enabling thus the development of optical transceivers for on-chip wireless broadcasting of information at the nanoscale.

preprint2014arXiv

Pre-determining the location of electromigrated gaps by nonlinear optical imaging

In this paper we describe a nonlinear imaging method employed to spatially map the occurrence of constrictions occurring on an electrically-stressed gold nanowire. The approach consists at measuring the influence of a tightly focused ultrafast pulsed laser on the electronic transport in the nanowire. We found that structural defects distributed along the nanowire are efficient nonlinear optical sources of radiation and that the differential conductance is significantly decreased when the laser is incident on such electrically-induced morphological changes. This imaging technique is applied to pre-determined the location of the electrical failure before it occurs.