Researcher profile

M. Lenczner

M. Lenczner contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2015arXiv

The Omega Counter, a Frequency Counter Based on the Linear Regression

This article introduces the Ω counter, a frequency counter -- or a frequency-to-digital converter, in a different jargon -- based on the Linear Regression (LR) algorithm on time stamps. We discuss the noise of the electronics. We derive the statistical properties of the Ω counter on rigorous mathematical basis, including the weighted measure and the frequency response. We describe an implementation based on a SoC, under test in our laboratory, and we compare the Ω counter to the traditional Π and Λ counters. The LR exhibits optimum rejection of white phase noise, superior to that of the Π and Λ counters. White noise is the major practical problem of wideband digital electronics, both in the instrument internal circuits and in the fast processes which we may want to measure. The Ω counter finds a natural application in the measurement of the Parabolic Variance, described in the companion article arXiv:1506.00687 [physics.data-an].

preprint2015arXiv

The Parabolic variance (PVAR), a wavelet variance based on least-square fit

This article introduces the Parabolic Variance (PVAR), a wavelet variance similar to the Allan variance, based on the Linear Regression (LR) of phase data. The companion article arXiv:1506.05009 [physics.ins-det] details the $Ω$ frequency counter, which implements the LR estimate. The PVAR combines the advantages of AVAR and MVAR. PVAR is good for long-term analysis because the wavelet spans over $2 τ$, the same of the AVAR wavelet; and good for short-term analysis because the response to white and flicker PM is $1/τ^3$ and $1/τ^2$, same as the MVAR. After setting the theoretical framework, we study the degrees of freedom and the confidence interval for the most common noise types. Then, we focus on the detection of a weak noise process at the transition - or corner - where a faster process rolls off. This new perspective raises the question of which variance detects the weak process with the shortest data record. Our simulations show that PVAR is a fortunate tradeoff. PVAR is superior to MVAR in all cases, exhibits the best ability to divide between fast noise phenomena (up to flicker FM), and is almost as good as AVAR for the detection of random walk and drift.