Source author record

M. Kreiter

M. Kreiter appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

physics.chem-ph physics.optics

Catalog footprint

What is connected

2works

2topics

4close collaborators

Actions

Connect this record

Open graph Browse works

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

preprint2010arXiv

Detecting molecules with plasmonic resonators - Analytic expressions and bounds for the sensitivity and figure of merit

We derive analytic expressions for the sensitivity and figure of merit for refractive index sensing with plasmonic resonators in the quasistatic limit. Based on these expressions the limits of detection and their origins are investigated. The critical role of limited energy concentration within the resonators surrounding is shown. The classical figure of merit is found to be solely dependent on the ratio of real to imaginary part of the resonators permittivity . Based on these findings we discuss the optimum resonance wavelength and resonator size and shape for single molecule detection.

preprint2005arXiv

Photoemission Electron Microscopy as a tool for the investigation of optical near fields

Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\hbarω_{UV}=5.0$ eV, wavelength $λ_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\hbarω_{l}=3.1$ eV, $λ_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower photon energies the emission is localized at tips of the structure. This is interpreted as a signature of the local electrical field therefore providing a tool to map the optical near field with the resolution of emission electron microscopy.