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Researcher profile

M. Bal

M. Bal contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.app-phquant-ph

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Published work

2 published item(s)

preprint2022arXiv

High quality superconducting Nb co-planar resonators on sapphire substrate

We present measurements and simulations of superconducting Nb co-planar waveguide resonators on sapphire substrate down to millikelvin temperature range with different readout powers. In the high temperature regime, we demonstrate that the Nb film residual surface resistance is comparable to that observed in the ultra-high quality, bulk Nb 3D superconducting radio frequency cavities while the resonator quality is dominated by the BCS thermally excited quasiparticles. At low temperature both the resonator quality factor and frequency can be well explained using the two-level system models. Through the energy participation ratio simulations, we find that the two-level system loss tangent is $\sim 10^{-2}$, which agrees quite well with similar studies performed on the Nb 3D cavities.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Dielectric loss extraction for superconducting microwave resonators

The investigation of two-level-state (TLS) loss in dielectric materials and interfaces remains at the forefront of materials research in superconducting quantum circuits. We demonstrate a method of TLS loss extraction of a thin film dielectric by measuring a lumped element resonator fabricated from a superconductor-dielectric-superconductor trilayer. We extract the dielectric loss by formulating a circuit model for a lumped element resonator with TLS loss and then fitting to this model using measurements from a set of three resonator designs: a coplanar waveguide resonator, a lumped element resonator with an interdigitated capacitor, and a lumped element resonator with a parallel plate capacitor that includes the dielectric thin film of interest. Unlike other methods, this allows accurate measurement of materials with TLS loss lower than $10^{-6}$. We demonstrate this method by extracting a TLS loss of $1.02 \times 10^{-3}$ for sputtered $\mathrm{Al_2O_3}$ using a set of samples fabricated from an $\mathrm{Al/Al_2O_3/Al}$ trilayer. We observe a difference of 11$\%$ between extracted loss of the trilayer with and without the implementation of this method.

0 citations0 reviewsNo code linkedOpen access