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L. Gelens contributes to research discovery and scholarly infrastructure.
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Published work
We study temporally localized structures in doubly resonant degenerate optical parametric oscillators in the absence of temporal walk-off. We focus on states formed through the locking of domain walls between the zero and a non-zero continuous wave solution. We show that these states undergo collapsed snaking and we characterize their dynamics in the parameter space.
We characterize the operation of semiconductor microring lasers in an excitable regime. Our experiments reveal a statistical distribution of the characteristics of noise-triggered optical pulses that is not observed in other excitable systems. In particular, an inverse correlation exists between the pulse amplitude and duration. Numerical simulations and an interpretation in an asymptotic phase space confirm and explain these experimentally observed pulse characteristics.
We theoretically investigate optical injection in semiconductor ring lasers and disclose several dynamical regimes. Through numerical simulations and bifurcation continuation, two separate parameter regions in which two different injection-locked solutions coexist are revealed, in addition to a region in which a frequency-locked limit cycle coexists with an injection-locked solution. Finally, an antiphase chaotic regime without the involvement of any carrier dynamics is revealed. Parallels are drawn with the onset of chaos in the periodically forced Duffing oscillator.
In order to investigate the size limit on spatial localized structures in a nonlinear system, we explore the impact of linear nonlocality on their domains of existence and stability. Our system of choice is an optical microresonator containing an additional metamaterial layer in the cavity, allowing the nonlocal response of the material to become the dominating spatial process. In that case, our bifurcation analysis shows that this nonlocality imposes a new limit on the width of localized structures going beyond the traditional diffraction limit.