Source author record

Kuo-Tang Liao

Kuo-Tang Liao appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
2topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2022arXiv

A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity

Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates complex nanofluidic replicas, optical localization microscopy, and novel statistical analyses. We apply our sample-in-answer-out system to measure polystyrene nanoparticles that sorb and carry hydrophobic fluorophores. An elegant scaling of surface forces automates advection and dominates diffusion to drive the analytical separation of colloidal nanoparticles by their steric diameters. Reference nanoparticles, with a mean of 99 nm and a standard deviation of 8.4 nm, test the unknown limits of silicone replicas to function as separation matrices. New calibrations correct aberrations from microscope and device, improving the accuracy of reducing single micrographs to joint histograms of steric diameter and fluorescence intensity. A dimensional model approaches the information limit of the system to discriminate size exclusion from surface adsorption, yielding errors of the mean ranging from 0.2 nm to 2.3 nm and errors of the standard deviation ranging from 2.2 nm to 4.2 nm. A hierarchical model accounts for metrological, optical, and dimensional variability to reveal a fundamental structure-property relationship. Intensity scales with diameter to the power of 3.6 +/- 0.5 at 95 % coverage, confounding basic concepts of surface adsorption or volume absorption. Distributions of fluorescivity - the product of the number density, absorption cross section, and quantum yield of an ensemble of fluorophores - are ultrabroad and asymmetric, limiting any inference from fluorescence intensity. This surprising characterization of common nanoplastics resets expectations for optimizing products, applying standards, and understanding byproducts.

preprint2022arXiv

Unmasking the resolution$-$throughput tradespace of focused-ion-beam machining

Focused-ion-beam machining is a powerful process to fabricate complex nanostructures, often through a sacrificial mask that enables milling beyond the resolution limit of the ion beam. However, current understanding of this super-resolution effect is empirical in the spatial domain and nonexistent in the temporal domain. This article reports the primary study of this fundamental tradespace of resolution and throughput. Chromia functions well as a masking material due to its smooth, uniform, and amorphous structure. An efficient method of in-line metrology enables characterization of ion-beam focus by scanning electron microscopy. Fabrication and characterization of complex test-structures through chromia and into silica probe the response of the bilayer to a focused beam of gallium cations, demonstrating super-resolution factors of up to 6 $\pm$ 2 and improvements to volume throughput of at least factors of 42 $\pm$ 2, with uncertainties denoting 95 % coverage intervals. Tractable theory models the essential aspects of the super-resolution effect for various nanostructures. Application of the new tradespace increases the volume throughput of machining Fresnel lenses by a factor of 75, which we introduce as projection standards for optical microscopy. These results enable paradigm shifts of sacrificial masking from empirical to engineering design, and from prototyping to manufacturing.