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Konstantin M. Zuev

Konstantin M. Zuev contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2020arXiv

History matching with probabilistic emulators and active learning

The scientific understanding of real-world processes has dramatically improved over the years through computer simulations. Such simulators represent complex mathematical models that are implemented as computer codes which are often expensive. The validity of using a particular simulator to draw accurate conclusions relies on the assumption that the computer code is correctly calibrated. This calibration procedure is often pursued under extensive experimentation and comparison with data from a real-world process. The problem is that the data collection may be so expensive that only a handful of experiments are feasible. History matching is a calibration technique that, given a simulator, it iteratively discards regions of the input space using an implausibility measure. When the simulator is computationally expensive, an emulator is used to explore the input space. In this paper, a Gaussian process provides a complete probabilistic output that is incorporated into the implausibility measure. The identification of regions of interest is accomplished with recently developed annealing sampling techniques. Active learning functions are incorporated into the history matching procedure to refocus on the input space and improve the emulator. The efficiency of the proposed framework is tested in well-known examples from the history matching literature, as well as in a proposed testbed of functions of higher dimensions.

preprint2011arXiv

Asymptotically Independent Markov Sampling: a new MCMC scheme for Bayesian Inference

In Bayesian statistics, many problems can be expressed as the evaluation of the expectation of a quantity of interest with respect to the posterior distribution. Standard Monte Carlo method is often not applicable because the encountered posterior distributions cannot be sampled directly. In this case, the most popular strategies are the importance sampling method, Markov chain Monte Carlo, and annealing. In this paper, we introduce a new scheme for Bayesian inference, called Asymptotically Independent Markov Sampling (AIMS), which is based on the above methods. We derive important ergodic properties of AIMS. In particular, it is shown that, under certain conditions, the AIMS algorithm produces a uniformly ergodic Markov chain. The choice of the free parameters of the algorithm is discussed and recommendations are provided for this choice, both theoretically and heuristically based. The efficiency of AIMS is demonstrated with three numerical examples, which include both multi-modal and higher-dimensional target posterior distributions.

preprint2011arXiv

Bayesian Post-Processor and other Enhancements of Subset Simulation for Estimating Failure Probabilities in High Dimensions

Estimation of small failure probabilities is one of the most important and challenging computational problems in reliability engineering. The failure probability is usually given by an integral over a high-dimensional uncertain parameter space that is difficult to evaluate numerically. This paper focuses on enhancements to Subset Simulation (SS), proposed by Au and Beck, which provides an efficient algorithm based on MCMC (Markov chain Monte Carlo) simulation for computing small failure probabilities for general high-dimensional reliability problems. First, we analyze the Modified Metropolis algorithm (MMA), an MCMC technique, which is used in SS for sampling from high-dimensional conditional distributions. We present some observations on the optimal scaling of MMA, and develop an optimal scaling strategy for this algorithm when it is employed within SS. Next, we provide a theoretical basis for the optimal value of the conditional failure probability $p_0$, an important parameter one has to choose when using SS. Finally, a Bayesian post-processor SS+ for the original SS method is developed where the uncertain failure probability that one is estimating is modeled as a stochastic variable whose possible values belong to the unit interval. Simulated samples from SS are viewed as informative data relevant to the system's reliability. Instead of a single real number as an estimate, SS+ produces the posterior PDF of the failure probability, which takes into account both prior information and the information in the sampled data. This PDF quantifies the uncertainty in the value of the failure probability and it may be further used in risk analyses to incorporate this uncertainty. The relationship between the original SS and SS+ is also discussed