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Klaus Leifer

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cond-mat.mtrl-sci cond-mat.mes-hall cond-mat.soft physics.chem-ph physics.data-an

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preprint2019arXiv

Enabling atomic resolution in convergent beam EMCD measurements by the use of patterned apertures

We give an experimental demonstration of two types of recently proposed ventilator apertures which can be used to acquire electron magnetic circular dichroic (EMCD) signals in zone axis orientation with high spatial resolution. To simplify the experimental procedures, we propose a third type of aperture and experimentally demonstrate the use of this modified ventilator aperture for the case of multiple symmetries in the diffraction patterns. To show the feasibility of the atomic resolution EMCD, EMCD signals are acquired for a range of beam convergence angles. High quality EMCD signals with convergence angles corresponding to atomic resolution electron probes are obtained.

preprint2015arXiv

Quantitative analysis of magnetic spin and orbital moments from an oxidized iron (1 1 0) surface using electron magnetic circular dichroism

Understanding the ramifications of reduced crystalline symmetry on magnetic behavior is a critical step in improving our understanding of nanoscale and interfacial magnetism. However, investigations of such effects are often controversial largely due to the challenges inherent in directly correlating nanoscale stoichiometry and structure to magnetic behavior. Here, we describe how to use Transmission Electron Microscope (TEM) to obtain Electron Magnetic Circular Dichroism (EMCD) signals as a function of scattering angle to locally probe the magnetic behavior of thin oxide layers grown on an Fe (1 1 0) surface. Experiments and simulations both reveal a strong dependence of the magnetic orbital to spin ratio on its scattering vector in reciprocal space. We exploit this variation to extract the magnetic properties of the oxide cladding layer, showing that it locally may exhibit an enhanced orbital to spin moment ratio. This finding is supported here by both spatially and angularly resolved EMCD measurements, opening up the way for compelling investigations into how magnetic properties are affected by nanoscale features.

preprint2012arXiv

A simple TEM method for fast thickness characterization of suspended graphene flakes

We present a simple and fast method for thickness characterization of suspended graphene flakes that is based on transmission electron microscopy (TEM) techniques. For this method, the dynamical theory of electron diffraction (Bloch-wave approach in two-beam case approximation) was used to obtain an analytical expression for the intensity of the transmitted electron beam I0(t), as function of the specimen thickness t for thin samples (t<< λ; where λ is the absorption constant for graphite). We show that in thin graphite crystals the transmitted intensity is a linear function of the thickness. To obtain a more quantitative description of I0(t), high resolution (HR) TEM simulations are performed using the Bloch wave approach of the JEMS software. From such calculations, we obtain λ for a 001 zone axis orientation, in a two-beam case and in a low symmetry orientation. Subsequently, HR (used to determine t) and bright-field (to measure I0(0) and I0(t)) images were acquired to experimentally determine λ. We obtain that the experimental value in the low symmetry orientation is close to the calculated value (i.e. λ=225 nm for 300 kV accelerating voltage and 3 mrad collection angle). The simulations also show that the linear approximation obtained from the analytical expression is valid up to a sample thickness of several ten nanometers, depending on the orientation. When compared to standard techniques for thickness determination of graphene/graphite, the method we propose has the advantage of being relatively simple and fast, requiring only the acquisition of bright-field images.

preprint2009arXiv

Conductivity engineering of graphene by defect formation

Transport measurements have revealed several exotic electronic properties of graphene. The possibility to influence the electronic structure and hence control the conductivity by adsorption or doping with adatoms is crucial in view of electronics applications. Here, we show that in contrast to expectation, the conductivity of graphene increases with increasing concentration of vacancy defects, by more than one order of magnitude. We obtain a pronounced enhancement of the conductivity after insertion of defects by both quantum mechanical transport calculations as well as experimental studies of carbon nano-sheets. Our finding is attributed to the defect induced mid-gap states, which create a region exhibiting metallic behavior around the vacancy defects. The modification of the conductivity of graphene by the implementation of stable defects is crucial for the creation of electronic junctions in graphene-based electronics devices.