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Kevin Ye

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2 publications

preprint2022arXiv

A new semiconducting perovskite alloy system made possible by gas-source molecular beam epitaxy

Optoelectronic technologies are based on families of semiconductor alloys. It is rare that a new semiconductor alloy family is developed to the point where epitaxial growth is possible; since the 1950s, this has happened approximately once per decade. Here we demonstrate epitaxial thin film growth of semiconducting chalcogenide perovskite alloys in the Ba-Zr-S-Se system by gas-source molecular beam epitaxy (MBE). We stabilize the full range y = 0 ... 3 of compositions BaZrS(3−y)_{(3-y)}Sey_y in the perovskite structure, up to and including BaZrSe3_3, by growing on BaZrS3_3 epitaxial templates. The resulting films are environmentally stable and the direct band gap (EgE_g) varies strongly with Se content, as predicted by theory, covering the range EgE_g = 1.9 ... 1.4 eV for yy = 0 ... 3. This creates possibilities for visible and near-infrared (VIS-NIR) optoelectronics, solid state lighting, and solar cells using chalcogenide perovskites.

preprint2019arXiv

Crystal growth and structural analysis of perovskite chalcogenide BaZrS3_3 and Ruddlesden-Popper phase Ba3_3Zr2_2S7_7

Perovskite chalcogenides are gaining substantial interest as an emerging class of semiconductors for optoelectronic applications. High quality samples are of vital importance to examine their inherent physical properties. We report the successful crystal growth of the model system, BaZrS3_3 and its Ruddlesden-Popper phase Ba3_3Zr2_2S7_7 by flux method. X-ray diffraction analyses showed space group of PnmaPnma with lattice constants of aa = 7.056(3) Å\/, bb = 9.962(4) Å\/, cc = 6.996(3) Å\/ for BaZrS3_3 and P42/mnmP4_2/mnm with aa = 7.071(2) Å\/, bb = 7.071(2) Å\/, cc = 25.418(5) Å\/ for Ba3_3Zr2_2S7_7. Rocking curves with full-width-at-half-maximum of 0.011∘^\circ for BaZrS3_3 and 0.027∘^\circ for Ba3_3Zr2_2S7_7 were observed. Pole figure analysis, scanning transmission electron microscopy images and electron diffraction patterns also establish high quality of grown crystals. The octahedra tilting in the corner-sharing octahedra network are analyzed by extracting the torsion angles.

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