Enhanced on-chip frequency measurement using weak value amplification
We present an integrated design to precisely measure optical frequency using weak value amplification with a multi-mode interferometer. The technique involves introducing a weak perturbation to the system and then post-selecting the data in such a way that the signal is amplified without amplifying the technical noise, as has previously been demonstrated in a free-space setup. We demonstrate the advantages of a Bragg grating with two band gaps for obtaining simultaneous, stable high transmission and high dispersion. We numerically model the interferometer in order to demonstrate the amplification effect. The device is shown to have advantages over both the free-space implementation and other methods of measuring optical frequency on a chip, such as an integrated Mach-Zehnder interferometer.