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Kees Flipse

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Published work

2 published item(s)

preprint2026arXiv

The interplay between topology, defects and chiral order in the nearly-commensurate charge density wave of 1T-TaS2

In 1T-TaS2, the nearly-commensurate charge density wave (NC-CDW) exhibits emergent chirality, a property of interest for technological applications such as memory. We study the relationship between chirality and topological defects using holographic analysis of scanning tunneling microscopy data. By characterizing the CDW order parameter, we uncover distinct topological defects and define a chiral order parameter that connects directly to them. Our analysis distinguishes between vortex pairs in high-strain areas and glass-like soliton or discommensurations networks. We propose that perturbations, such as strain, drive vortex nucleation and annihilation, leaving solitons or discommensurations pinned by disorder. Electric fields induce soliton and discommensurations movement, causing chiral switching via localized order parameter melting, enabling controllable room-temperature chirality

preprint2022arXiv

Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes

We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically perturb the oscillation of the tuning fork, resulting in poor performance in its intrinsic force sensing. Therefore, restoring initial oscillatory characteristics is necessary for regaining high sensitivity. To this end, we developed a new approach consisting of three basic steps: tuning fork rebalancing, revamping holder-sensor fixation, and electrode reconfiguration. Mass rebalancing allows the tuning fork to recover the frequency and regain high Q-factor values up to 10E4 in air and up to 4 x 10E4 in ultra-high vacuum conditions. The floating-like holder-fixation using soft wires significantly reduces energy dissipation from the mounting elements. Combined with the soft wires, reconfigured electrodes provide electrical access to the chip-like probe without intervening in the force-sensing signal. Finally, our easy-to-implement approach allows converting the atomic force microscopy-tip from a passive tool to a dedicated microdevice with extended functionality.