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K Fujii

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physics.atom-ph physics.plasm-ph physics.ins-det

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preprint2020arXiv

Visible emission spectroscopy of highly charged tungsten ions in LHD: I. Survey of new visible emission lines

We found 12 unknown visible emission lines from the core plasma of large helical device with highly charged tungsten ions accumulated. The observation was made with our home-built echelle spectrometer, which covers the wavelength range of 450-715 nm with a wavelength resolution of<0.05 nm for two lines of sight; one line passes both the core and edge plasmas and the other passes only the edge plasma. These emission lines are attributed to highly charged tungsten ions because (1) they were observed only after a tungsten pellet was injected into the plasma, (2) they were observed only from the core plasma where the electron temperature is 1 keV, (3) they show line broadenings that are close to the Doppler widths of tungsten ions with 1 keV temperature and (4) the wavelengths of some of these emission lines are close to the calculation results for tungsten ions in the charge state of 25-28.

preprint2020arXiv

Visible emission spectroscopy of highly charged tungsten ions in LHD: II. Evaluation of tungsten ion temperature

We demonstrated a polarization-resolved high resolution spectroscopy of a visible emission line of highly charged tungsten ions (λ0 = 668.899 nm, Shinohara et al Phys. Scr. 90 125402) for the large helical device (LHD) plasma, where the tungsten ions were introduced by a pellet injection. Its spectral profile shows broadening and polarization dependence, which are attributed to the Doppler and Zeeman effects, respectively. The tungsten ion temperature was evaluated for the first time from the broadening of visible the emission line, with its emission location determined by the Abel inversion of the chord-integrated emission intensities observed with multiple chords. The tungsten ion temperature was found to be close to the helium-like argon ion temperature, which is used as an ion temperature monitor in LHD

preprint2015arXiv

Improved measurement results for the Avogadro constant using a 28Si-enriched crystal

New results are reported from an ongoing international research effort to accurately determine the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The surfaces of two 28Si-enriched spheres were decontaminated and reworked in order to produce an outer surface without metal contamination and improved sphericity. New measurements were then made on these two reconditioned spheres using improved methods and apparatuses. When combined with other recently refined parameter measurements, the Avogadro constant derived from these new results has a value of $N_A = 6.022 140 76(12) \times 10^{23}$ mol$^{-1}$. The X-ray crystal density method has thus achieved the target relative standard uncertainty of $2.0 \times 10^{-8}$ necessary for the realization of the definition of the new kilogram.