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Juan Manuel Gorriz

Juan Manuel Gorriz contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

An overview of deep learning techniques for epileptic seizures detection and prediction based on neuroimaging modalities: Methods, challenges, and future works

Epilepsy is a disorder of the brain denoted by frequent seizures. The symptoms of seizure include confusion, abnormal staring, and rapid, sudden, and uncontrollable hand movements. Epileptic seizure detection methods involve neurological exams, blood tests, neuropsychological tests, and neuroimaging modalities. Among these, neuroimaging modalities have received considerable attention from specialist physicians. One method to facilitate the accurate and fast diagnosis of epileptic seizures is to employ computer-aided diagnosis systems (CADS) based on deep learning (DL) and neuroimaging modalities. This paper has studied a comprehensive overview of DL methods employed for epileptic seizures detection and prediction using neuroimaging modalities. First, DL-based CADS for epileptic seizures detection and prediction using neuroimaging modalities are discussed. Also, descriptions of various datasets, preprocessing algorithms, and DL models which have been used for epileptic seizures detection and prediction have been included. Then, research on rehabilitation tools has been presented, which contains brain-computer interface (BCI), cloud computing, internet of things (IoT), hardware implementation of DL techniques on field-programmable gate array (FPGA), etc. In the discussion section, a comparison has been carried out between research on epileptic seizure detection and prediction. The challenges in epileptic seizures detection and prediction using neuroimaging modalities and DL models have been described. In addition, possible directions for future works in this field, specifically for solving challenges in datasets, DL, rehabilitation, and hardware models, have been proposed. The final section is dedicated to the conclusion which summarizes the significant findings of the paper.

preprint2020arXiv

A connection between the pattern classification problem and the General Linear Model for statistical inference

A connection between the General Linear Model (GLM) in combination with classical statistical inference and the machine learning (MLE)-based inference is described in this paper. Firstly, the estimation of the GLM parameters is expressed as a Linear Regression Model (LRM) of an indicator matrix, that is, in terms of the inverse problem of regressing the observations. In other words, both approaches, i.e. GLM and LRM, apply to different domains, the observation and the label domains, and are linked by a normalization value at the least-squares solution. Subsequently, from this relationship we derive a statistical test based on a more refined predictive algorithm, i.e. the (non)linear Support Vector Machine (SVM) that maximizes the class margin of separation, within a permutation analysis. The MLE-based inference employs a residual score and includes the upper bound to compute a better estimation of the actual (real) error. Experimental results demonstrate how the parameter estimations derived from each model resulted in different classification performances in the equivalent inverse problem. Moreover, using real data the aforementioned predictive algorithms within permutation tests, including such model-free estimators, are able to provide a good trade-off between type I error and statistical power.