Source author record

Jordi Tiana-Alsina

Jordi Tiana-Alsina appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
4topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2020arXiv

Experimental study of speckle patterns generated by low-coherence semiconductor laser light

Speckle is a wave interference phenomenon that has been studied in various fields, including optics, hydrodynamics and acoustics. Speckle patterns contain spectral information of the interfering waves, and of the scattering medium that generates the pattern. Here we study experimentally the speckle patterns generated by the light emitted by two types of semiconductor lasers: conventional laser diodes, where we induce low-coherence emission by optical feedback or by pump current modulation, and coupled nanolasers. In both cases we analyze the intensity statistics of the respective speckle patterns to inspect the degree of coherence of the light. We show that that speckle analysis provides a non-spectral way to assess the coherence of semiconductor laser light.

preprint2020arXiv

Success rate analysis of the response of an excitable laser to periodic perturbations

We use statistical tools to characterize the response of an excitable system to periodic perturbations. The system is an optically injected semiconductor laser under pulsed perturbations of the phase of the injected field. We characterize the laser response by counting the number of pulses emitted by the laser, within a time interval, $Δ$T , that starts when a perturbation is applied. The success rate, SR($Δ$T), is then defined as the number of pulses emitted in the interval $Δ$T , relative to the number of perturbations. The analysis of the variation of SR with $Δ$T allows to separate a constant lag of technical origin and a frequency-dependent lag of physical and dynamical origin. Once the lag is accounted for, the success rate clearly captures locked and unlocked regimes and the transitions between them. We anticipate that the success rate will be a practical tool for analyzing the output of periodically forced systems, particularly when very regular oscillations need to be generated via small periodic perturbations.