Researcher profile

Jonah N. Gollub

Jonah N. Gollub contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Electronically Steered Nyquist Metasurface Antenna

Mobile devices, climate science, and autonomous vehicles all require advanced microwave antennas for imaging, radar, and wireless communications. The cost, size, and power consumption of existing technology, however, has hindered the ubiquity of electronically steered systems. Here, we propose a metasurface antenna design paradigm that enables electronic beamsteering from a passive lightweight circuit board with varactor-tuned elements. Distinct from previous metasurfaces (which require dense element spacing), the proposed design uses Nyquist spatial sampling of half a wavelength. We detail the design of this Nyquist metasurface antenna and experimentally validate its ability to electronically steer in two directions. Nyquist metasurface antennas can realize high performance without costly and power hungry phase shifters, making them a compelling technology for future antenna hardware.

preprint2013arXiv

An effective cavity resonance model for enhanced optical transmission through arrays of subwavelength apertures in metal films

We present a novel theoretical approach for modeling the resonant properties of transmission through subwavelength apertures penetrating metal films. We show that cavity mode theory applies to an effective resonant cavity whose dimensions are determined by the aperture's geometry and the evanescent decay lengths of the associated diffracted waves. This method suggests a concrete physical mechanism for the enhanced transmission observed in periodic aperture arrays, namely it is the evanescently scattered light, localized in the near field of metal surface, which couples into the apertures. Furthermore, it analytically predicts the frequencies of peaks in enhanced transmission, the quality factor of the peaks, and explains their dependence on variation in the hole radius, periodicity, and the film thickness over a wide range of geometries. This model demonstrates strong correlation to simulation and existing results with a high degree of accuracy.