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Jingwen Hu

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physics.app-ph physics.optics Artificial Intelligence Computation and Language Computer Vision cond-mat.mtrl-sci

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preprint2022arXiv

M3ED: Multi-modal Multi-scene Multi-label Emotional Dialogue Database

The emotional state of a speaker can be influenced by many different factors in dialogues, such as dialogue scene, dialogue topic, and interlocutor stimulus. The currently available data resources to support such multimodal affective analysis in dialogues are however limited in scale and diversity. In this work, we propose a Multi-modal Multi-scene Multi-label Emotional Dialogue dataset, M3ED, which contains 990 dyadic emotional dialogues from 56 different TV series, a total of 9,082 turns and 24,449 utterances. M3 ED is annotated with 7 emotion categories (happy, surprise, sad, disgust, anger, fear, and neutral) at utterance level, and encompasses acoustic, visual, and textual modalities. To the best of our knowledge, M3ED is the first multimodal emotional dialogue dataset in Chinese. It is valuable for cross-culture emotion analysis and recognition. We apply several state-of-the-art methods on the M3ED dataset to verify the validity and quality of the dataset. We also propose a general Multimodal Dialogue-aware Interaction framework, MDI, to model the dialogue context for emotion recognition, which achieves comparable performance to the state-of-the-art methods on the M3ED. The full dataset and codes are available.

preprint2021arXiv

Beyond Lambertian light trapping for large-area silicon solar cells: fabrication methods

Light trapping photonic crystal (PhC) patterns on the surface of Si solar cells provides a novel opportunity to approach the theoretical efficiency limit of 32.3%, for light-to-electrical power conversion with a single junction cell. This is beyond the efficiency limit implied by the Lambertian limit of ray trapping 29%. The interference and slow light effects are harnessed for collecting light even at the long wavelengths near the Si band-gap. We compare two different methods for surface patterning, that can be extended to large area surface patterning: 1) laser direct write and 2) step-&-repeat 5-times reduction projection lithography. Large area throughput limitations of these methods are compared with the established electron beam lithography (EBL) route, which is conventionally utilised but much slower than the presented methods. Spectral characterisation of the PhC light trapping is compared for samples fabricated by different methods. Reflectance of Si etched via laser patterned mask was 7% at visible wavelengths and was comparable with Si patterned via EBL made mask. The later pattern showed a stronger absorbance than the Lambertian limit (M.-L. Hsieh et al., Sci. Rep. 10, 11857 (2020)).

preprint2020arXiv

Tilted black-Si: ~0.45 form-birefringence from sub-wavelength needles

The self-organised conical needles produced by plasma etching of silicon (Si), known as black silicon (b-Si), create a form-birefringent surface texture when etching of Si orientated at angles of $θ_i < 50 - 70^\circ$ (angle between the Si surface and vertical plasma E-field). The height of the needles in the form-birefringent region following 15~min etching was $d\sim 200$ nm and had a 100 $μ$m width of the optical retardance/birefringence, characterised using polariscopy. The height of the b-Si needles corresponds closely to the skin-depth of Si $\simλ/4$ for the visible spectral range. Reflection-type polariscope with a voltage-controlled liquid-crystal retarder is proposed to directly measure the retardance $Δn\times d/λ\approx 0.15$ of the region with tilted b-Si needles. The quantified form birefringence of $Δn = - 0.45$ over $λ= 400-700$~nm spectral window was obtained. Such high values of $Δn$ at visible wavelengths can only be observed in the most birefringence calcite or barium borate as well as in liquid crystals. The replication of b-Si into Ni-shim with high fidelity was also demonstrated and can be used for imprinting of the b-Si nanopattern into other materials.

preprint2015arXiv

Dense v.s. Sparse: A Comparative Study of Sampling Analysis in Scene Classification of High-Resolution Remote Sensing Imagery

Scene classification is a key problem in the interpretation of high-resolution remote sensing imagery. Many state-of-the-art methods, e.g. bag-of-visual-words model and its variants, the topic models as well as deep learning-based approaches, share similar procedures: patch sampling, feature description/learning and classification. Patch sampling is the first and a key procedure which has a great influence on the results. In the literature, many different sampling strategies have been used, {e.g. dense sampling, random sampling, keypoint-based sampling and saliency-based sampling, etc. However, it is still not clear which sampling strategy is suitable for the scene classification of high-resolution remote sensing images. In this paper, we comparatively study the effects of different sampling strategies under the scenario of scene classification of high-resolution remote sensing images. We divide the existing sampling methods into two types: dense sampling and sparse sampling, the later of which includes random sampling, keypoint-based sampling and various saliency-based sampling proposed recently. In order to compare their performances, we rely on a standard bag-of-visual-words model to construct our testing scheme, owing to their simplicity, robustness and efficiency. The experimental results on two commonly used datasets show that dense sampling has the best performance among all the strategies but with high spatial and computational complexity, random sampling gives better or comparable results than other sparse sampling methods, like the sophisticated multi-scale key-point operators and the saliency-based methods which are intensively studied and commonly used recently.