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Researcher profile

Jim Ciston

Jim Ciston contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-sciComputer Visionphysics.app-ph

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Published work

4 published item(s)

preprint2026arXiv

Predictive autoencoder-transformer model of Cu oxidation state from EELS and XAS spectra

X-ray absorption spectroscopy (XAS) and electron energy-loss spectroscopy (EELS) produce detailed information about oxidation state, bonding, and coordination, making them essential for quantitative studies of redox and structure in functional materials. However, high-throughput quantitative analysis of these spectra, especially for mixed valence materials, remains challenging as diverse experimental conditions introduce noise, misalignment, broadening of the spectral features. We address this challenge by training a machine learning model consisting of an autoencoder to standardize the spectra and a transformer model to predict both Cu oxidation state and Bader charge directly from L-edge spectra. The model is trained on a large dataset of FEFF-simulated spectra and evaluates model performance on both simulated and experimental data. The results of the machine learning model exhibit highly accurate prediction across the domains of simulated and experimental XAS as well as experimental EELS. These advances enable future quantitative analysis of Cu redox processes under in situ and operando conditions.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabilized zirconia,Y$_{0.095}$Zr$_{0.905}$O$_2$ , heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb-Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Deep Learning Coherent Diffractive Imaging

We report the development of deep learning coherent electron diffractive imaging at sub-angstrom resolution using convolutional neural networks (CNNs) trained with only simulated data. We experimentally demonstrate this method by applying the trained CNNs to directly recover the phase images from electron diffraction patterns of twisted hexagonal boron nitride, monolayer graphene and a Au nanoparticle with comparable quality to those reconstructed by a conventional ptychographic method. Fourier ring correlation between the CNN and ptychographic images indicates the achievement of a spatial resolution in the range of 0.70 and 0.55 angstrom (depending on different resolution criteria). The ability to replace iterative algorithms with CNNs and perform real-time imaging from coherent diffraction patterns is expected to find broad applications in the physical and biological sciences.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain mapping for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limited, particularly in thick samples where the electron beam can undergo multiple scattering, which introduces signal nonlinearities. Deep learning methods have the potential to invert these complex signals, but previous implementations are often trained only on specific crystal systems or a small subset of the crystal structure and microscope parameter phase space. In this study, we implement a Fourier space, complex-valued deep neural network called FCU-Net, to invert highly nonlinear electron diffraction patterns into the corresponding quantitative structure factor images. We trained the FCU-Net using over 200,000 unique simulated dynamical diffraction patterns which include many different combinations of crystal structures, orientations, thicknesses, microscope parameters, and common experimental artifacts. We evaluated the trained FCU-Net model against simulated and experimental 4D-STEM diffraction datasets, where it substantially out-performs conventional analysis methods. Our simulated diffraction pattern library, implementation of FCU-Net, and trained model weights are freely available in open source repositories, and can be adapted to many different diffraction measurement problems.

0 citations0 reviewsNo code linkedOpen access