Source author record

J. R. Jinschek

J. R. Jinschek appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
1topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2026arXiv

On the Feasibility of Extreme Heating Rates in SEM using MEMS Heater Platforms

Understanding microstructural evolution under extreme thermal conditions is essential for advancing metal additive manufacturing (AM). This work demonstrates the feasibility of employing micro-electro-mechanical system (MEMS) heating platforms for in-situ scanning electron microscopy (SEM) characterization of bulk-like samples during rapid thermal cycling. Using electron backscatter diffraction (EBSD), we tracked the ferrite-to-austenite phase transformation in a pure iron specimen and confirmed that the sample surface temperature closely follows the MEMS temperature setpoint within device accuracy. Under vacuum conditions, stable heating and cooling rates of up to 1000 C/s were achieved with minimal power input and without compromising EBSD pattern quality. These findings establish MEMS-based heating as a robust approach for in-situ microstructural characterization of AM-relevant thermal processes in the SEM, enabling quantitative studies of thermally activated phenomena such as diffusion, phase transformations, and microstructural evolution under far-from-equilibrium conditions.

preprint2013arXiv

Characterization of Fe-N nano crystals and nitrogen-containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy

Nanometric inclusions filled with nitrogen, located adjacent to FenN (n = 3 or 4) nanocrystals within (Ga,Fe)N layers, are identified and characterized using scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS). High-resolution STEM images reveal a truncation of the Fe-N nanocrystals at their boundaries with the nitrogen-containing inclusion. A controlled electron beam hole drilling experiment is used to release nitrogen gas from an inclusion in situ in the electron microscope. The density of nitrogen in an individual inclusion is measured to be 1.4 +- 0.3 g/cm3. These observations provide an explanation for the location of surplus nitrogen in the (Ga,Fe)N layers, which is liberated by the nucleation of FenN (n> 1) nanocrystals during growth.