Researcher profile

J. -M. André

J. -M. André contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2011arXiv

Introduction of Zr in nanometric periodic Mg/Co multilayers

We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45deg of grazing incidence and reaches 51.3% upon annealing at 200deg C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.

preprint2011arXiv

On the Kramers-Kronig transform with logarithmic kernel for the reflection phase in the Drude model

We use the Kramers-Kronig transform (KKT) with logarithmic kernel to obtain the reflection phase and, subsequently, the complex refractive index of a bulk mirror from reflectance. However, there remains some confusion regarding the formulation for this analysis. Assuming the damped Drude model for the dielectric constant and the oblique incidence case, we calculate the additional terms: phase at zero frequency and Blashke factor and we propose a reformulated KKT within this model. Absolute reflectance in the s-polarization case of a gold film is measured between 40 and 350 eV for various glancing angles using synchrotron radiation and its complex refractive index is deduced using the reformulated KKT that we propose. The results are discussed with respect to the data available in the literature.

preprint2005arXiv

X-ray Raman scattering with Bragg diffraction in a La-based superlattice

The non-dispersed soft x-ray emission from a La/B4C periodic multilayer irradiated by monochromatic x-rays has been measured as a function of the incident photon energy in the 125-200 eV range for different scattering angles. We have observed a scattered intensity peak at incident energies which shift towards the low-energy side as the value of the scattering angle increases. These observations are interpreted as Raman scattering by the 5p level of lanthanum assisted by Bragg diffraction from the lattice of the periodic multilayer. A simple model based upon the laws of energy and momentum conservation enables us to account for the variation of the incident energy associated with the Bragg-Raman peak.