Researcher profile

J. Grenzer

J. Grenzer contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 13 - UnverifiedVerification L1Unclaimed author
2works
0followers
3topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Identity and collaboration

How to connect with this researcher

Claiming links this public author record to a researcher profile and unlocks direct collaboration workflows.

Log in to claim

Direct collaboration

Open a focused conversation when the fit is right

Claim this author entity first to unlock direct invitations.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2022arXiv

In-situ measurements of dendrite tip shape selection in a metallic alloy

The size and shape of the primary dendrite tips determine the principal length scale of the microstructure evolving during solidification of alloys. In-situ X-ray measurements of the tip shape in metals have been unsuccessful so far due to insufficient spatial resolution or high image noise. To overcome these limitations, high-resolution synchrotron radiography and advanced image processing techniques are applied to a thin sample of a solidifying Ga-35wt.%In alloy. Quantitative in-situ measurements are performed of the growth of dendrite tips during the fast initial transient and the subsequent steady growth period, with tip velocities ranging over almost two orders of magnitude. The value of the dendrite tip shape selection parameter is found to be $σ^* = 0.0768$, which suggests an interface energy anisotropy of $\varepsilon_4 = 0.015$ for the present Ga-In alloy. The non-axisymmetric dendrite tip shape amplitude coefficient is measured to be $A_4 \approx 0.004$, which is in excellent agreement with the universal value previously established for dendrites.

preprint2022arXiv

Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting

We present results from the SPring-8 Angstrom Compact free electron LAser (SACLA) XFEL facility, using a high intensity ($\sim\!10^{20}\,$W/cm$^2$) X-ray pump X-ray probe scheme to observe changes in the ionic structure of silicon induced by X-ray heating of the electrons. By avoiding Laue spots in the scattering signal from a single crystalline sample, we observe a rapid rise in diffuse scattering, which we attribute to a loss of lattice order and a transition to a liquid state within 100 fs of irradiation, a timescale which agrees well with first principles simulations, but is faster than that predicted by purely inertial behavior. This method is capable of observing liquid scattering without masking or filtering of signal from the ambient solid, allowing the liquid structure to be measured throughout and beyond the phase change.