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Ivan Bobrov

Ivan Bobrov appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

3 published item(s)

preprint2020arXiv

Single atom movement with dynamic holographic optical tweezers

We report an experimental implementation of dynamical holographic tweezers for single trapped atoms. The tweezers are realized with dynamical phase holograms displayed on the liquid crystal spatial light modulator. We experimentally demonstrate the possibility to trap and move single rubidium atoms with such dynamic potentials, and study its limitations. Our results suggest that high probability transfer of single atoms in the tweezers may be performed in large steps, much larger then the trap waist. We discuss intensity-flicker in holographic traps and techniques for its suppression. Loss and heating rates in dynamic tweezers are measured and no excess loss or heating is observed in comparison with static traps.

preprint2014arXiv

Tomography of Spatial Mode Detectors

Transformation and detection of photons in higher-order spatial modes usually requires complicated holographic techniques. Detectors based on spatial holograms suffer from non-idealities and should be carefully calibrated. We report a novel method for analyzing the quality of projective measurements in spatial mode basis inspired by quantum detector tomography. It allows us to calibrate the detector response using only gaussian beams. We experimentally investigate the inherent inaccuracy of the existing methods of mode transformation and provide a full statistical reconstruction of the POVM (positive operator valued measure) elements for holographic spatial mode detectors.

preprint2013arXiv

Self-calibrating Tomography for Angular Schmidt Modes in Spontaneous Parametric Down-Conversion

We report an experimental self-calibrating tomography scheme for entanglement characterization in high-dimensional quantum systems using Schmidt decomposition techniques. The self-tomography technique based on maximal likelihood estimation was developed for characterizing non-ideal measurements in Schmidt basis allowing us to infer both Schmidt eigenvalues and detecting efficiencies.