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Researcher profile

Isaac Arnquist

Isaac Arnquist contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
hep-exhep-phphysics.ins-det

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Published work

3 published item(s)

preprint2022arXiv

A Search for Low-mass Dark Matter via Bremsstrahlung Radiation and the Migdal Effect in SuperCDMS

In this paper, we present a re-analysis of SuperCDMS data using a profile likelihood approach to search for sub-GeV dark matter particles (DM) through two inelastic scattering channels: bremsstrahlung radiation and the Migdal effect. By considering possible inelastic scattering channels, experimental sensitivity can be extended to DM masses that would otherwise be undetectable through the DM-nucleon elastic scattering channel, given the energy threshold of current experiments. We exclude DM masses down to $220~\textrm{MeV}/c^2$ at $2.7 \times 10^{-30}~\textrm{cm}^2$ via the bremsstrahlung channel. The Migdal channel search excludes DM masses down to $30~\textrm{MeV}/c^2$ at $5.0 \times 10^{-30}~\textrm{cm}^2$.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Snowmass2021 Cosmic Frontier White Paper: Calibrations and backgrounds for dark matter direct detection

Future dark matter direct detection experiments will reach unprecedented levels of sensitivity. Achieving this sensitivity will require more precise models of signal and background rates in future detectors. Improving the precision of signal and background modeling goes hand-in-hand with novel calibration techniques that can probe rare processes and lower threshold detector response. The goal of this white paper is to outline community needs to meet the background and calibration requirements of next-generation dark matter direct detection experiments.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Evaluation and mitigation of trace $^{210}$Pb contamination on copper surfaces

Clean materials are required to construct and operate many low-background physics experiments. High-purity copper has found broad use because of its physical properties and availability. In this paper, we describe methods to assay and mitigate $^{210}$Pb contamination on copper surfaces, such as from exposure to environmental radon or coming from bulk impurities. We evaluated the efficacy of wet etching on commercial samples and observed that $^{210}$Po contamination from the copper bulk does not readily pass into solution. During the etch, the polonium appears to trap at the copper-etchant boundary, such that it is effectively concentrated at the copper surface. We observed a different behavior for $^{210}$Pb; high-sensitivity measurements of the alpha emissivity versus time indicate the lowest level of $^{210}$Pb contamination ever reported for a commercial copper surface: $0\pm12$ nBq/cm$^2$ (1$σ$). Additionally, we have demonstrated the effectiveness of mitigating trace $^{210}$Pb and $^{210}$Po surface backgrounds using custom, high-purity electroplating techniques. These approaches were evaluated utilizing assays performed with an XIA UltraLo-1800 alpha spectrometer.

0 citations0 reviewsNo code linkedOpen access