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Researcher profile

Ian Appelbaum

Ian Appelbaum contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-scicond-mat.mes-hallcond-mat.othercond-mat.supr-con

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Published work

7 published item(s)

preprint2013arXiv

Tunnel conductance spectroscopy via harmonic generation in a hybrid capacitor device

We address the measurement of density of states within and beyond the superconducting gap in tunnel-coupled finite-size nanostructures using a capacitive method. Third-harmonic generation is used to yield the full differential conductance spectrum without destruction of the low dimensionality otherwise induced by intimate ohmic coupling to an electrode. The method is particularly relevant to attempts to discern the presence of the fragile Majorana quasiparticle at the end of spin-orbit-coupled nanowires in appropriate magnetic field conditions by their signature mid-gap density of states.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Field-induced negative differential spin lifetime in silicon

We show that the electric field-induced thermal asymmetry between the electron and lattice systems in pure silicon substantially impacts the identity of the dominant spin relaxation mechanism. Comparison of empirical results from long-distance spin transport devices with detailed Monte-Carlo simulations confirms a strong spin depolarization beyond what is expected from the standard Elliott-Yafet theory already at low temperatures. The enhanced spin-flip mechanism is attributed to phonon emission processes during which electrons are scattered between conduction band valleys that reside on different crystal axes. This leads to anomalous behavior, where (beyond a critical field) reduction of the transit time between spin-injector and spin-detector is accompanied by a counterintuitive reduction in spin polarization and an apparent negative spin lifetime.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Modeling spin transport in electrostatically-gated lateral-channel silicon devices: role of interfacial spin relaxation

Using a two-dimensional finite-differences scheme to model spin transport in silicon devices with lateral geometry, we simulate the effects of spin relaxation at interfacial boundaries, i.e. the exposed top surface and at an electrostatically-controlled backgate with SiO_2 dielectric. These gate-voltage-dependent simulations are compared to previous experimental results and show that strong spin relaxation due to extrinsic effects yield an Si/SiO_2 interfacial spin lifetime of ~ 1ns, orders of magnitude lower than lifetimes in the bulk Si, whereas relaxation at the top surface plays no substantial role. Hall effect measurements on ballistically injected electrons gated in the transport channel yield the carrier mobility directly and suggest that this reduction in spin lifetime is only partially due to enhanced interfacial momentum scattering which induces random spin flips as in the Elliott effect. Therefore, other extrinsic mechanisms such as those caused by paramagnetic defects should also be considered in order to explain the dramatic enhancement in spin relaxation at the gate interface over bulk values.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Spin-Polarized Transient Electron Trapping in Phosphorus-doped Silicon

Experimental evidence of electron spin precession during travel through the phosphorus-doped Si channel of an all-electrical device simultaneously indicates two distinct processes: (i) short timescales (~50ps) due to purely conduction-band transport from injector to detector, and (ii) long timescales (~1ns) originating from delays associated with capture/re-emission in shallow impurity traps. The origin of this phenomenon, examined via temperature, voltage, and electron density dependence measurements, is established by means of comparison to a numerical model and is shown to reveal the participation of metastable excited states in the phosphorus impurity spectrum. This work therefore demonstrates the potential to make the study of macroscopic spin transport relevant to the quantum regime of individual spin interactions with impurities as envisioned for quantum information applications.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Proposal for a Topological Plasmon Spin Rectifier

We propose a device in which the spin-polarized AC plasmon mode in the surface state of a topological insulator nanostructure induces a static spin accumulation in a resonant, normal metal structure coupled to it. Using a finite-difference time-domain model, we simulate this spin-pump mechanism with drift, diffusion, relaxation, and precession in a magnetic field. This optically-driven system can serve as a DC "spin battery" for spintronic devices.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Reverse Schottky-Asymmetry Spin Current Detectors

By reversing the Schottky barrier-height asymmetry in hot-electron semiconductor-metal-semiconductor ballistic spin filtering spin detectors, we have achieved: 1. Demonstration of >50% spin polarization in silicon, resulting from elimination of the ferromagnet/silicon interface on the transport channel detector contact, and 2. Evidence of spin transport at temperatures as high as 260K, enabled by an increase of detector Schottky barrier height.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

The Larmor clock and anomalous spin dephasing in silicon

Drift-diffusion theory - which fully describes charge transport in semiconductors - is also universally used to model transport of spin-polarized electrons in the presence of longitudinal electric fields. By transforming spin transit time into spin orientation with precession (a technique called the "Larmor clock") in current-sensing vertical-transport intrinsic Si devices, we show that spin diffusion (and concomitant spin dephasing) can be greatly enhanced with respect to charge diffusion, in direct contrast to predictions of spin Coulomb-drag diffusion suppression.

0 citations0 reviewsNo code linkedOpen access