Researcher profile

I. Rabuffo

I. Rabuffo contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2011arXiv

Quantum tricriticality in transverse Ising-like systems

The quantum tricriticality of d-dimensional transverse Ising-like systems is studied by means of a perturbative renormalization group approach focusing on static susceptibility. This allows us to obtain the phase diagram for 3<d<4, with a clear location of the critical lines ending in the conventional quantum critical points and in the quantum tricritical one, and of the tricritical line for temperature T \geq 0. We determine also the critical and the tricritical shift exponents close to the corresponding ground state instabilities. Remarkably, we find a tricritical shift exponent identical to that found in the conventional quantum criticality and, by approaching the quantum tricritical point increasing the non-thermal control parameter r, a crossover of the quantum critical shift exponents from the conventional value ϕ= 1/(d-1) to the new one ϕ= 1/2(d-1). Besides, the projection in the (r,T)-plane of the phase boundary ending in the quantum tricritical point and crossovers in the quantum tricritical region appear quite similar to those found close to an usual quantum critical point. Another feature of experimental interest is that the amplitude of the Wilsonian classical critical region around this peculiar critical line is sensibly smaller than that expected in the quantum critical scenario. This suggests that the quantum tricriticality is essentially governed by mean-field critical exponents, renormalized by the shift exponent ϕ= 1/2(d-1) in the quantum tricritical region.

preprint2005arXiv

Critical behaviour of thin films with quenched impurities

The critical behaviour of thin films containing quenched random impurities and inhomogeneities is investigated by the renormalization-group method. The finite-size crossover in impure films has been considered on the basis of the fundamental relationship between the effective spatial dimensionality and the characteristic lengths of the system. The difference between the critical properties of infinite systems and films is demonstrated and investigated. A new critical exponent, describing the scaling properties of the thickness of films with extended impurities has been deduced and calculated. A special attention is paid to the critical behaviour of real impure films.