Researcher profile

Herko P. van der Meulen

Herko P. van der Meulen contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Direct visualization and effects of atomic-scale defects on the optoelectronic properties of hexagonal boron nitride

Hexagonal boron nitride (hBN) is attracting a lot of attention in the last years, thanks to its many remarkable properties. These include the presence of single-photon emitters with superior optical properties, which make it an ideal candidate for a plethora of photonic technologies. However, despite the large number of experimental results and theoretical calculations, the structure of the defects responsible for the observed emission is still under debate. In this work, we visualize individual atomic-scale defects in hBN with atomic force microscopy under ambient conditions and observe multiple narrow emission lines from optically stable emitters. This direct observation of the structure of the defects combined with density functional theory calculations of their band structures and electronic properties allows us to associate the existence of several single-photon transitions to the observed defects. Our work sheds light on the origin of single-photon emission in hBN that is important for the understanding and tunability of high-quality emitters in optoelectronics and quantum technologies.

preprint2015arXiv

Spatially resolved optical absorption spectroscopy of single- and few-layer MoS2 by hyperspectral imaging

The possibility of spatially resolving the optical properties of atomically thin materials is especially appealing as they can be modulated at the micro- and nanoscale by reducing their thickness, changing the doping level or applying a mechanical deformation. Therefore, optical spectroscopy techniques with high spatial resolution are necessary to get a deeper insight into the properties of two-dimensional materials. Here we study the optical absorption of single- and few-layer molybdenum disulfide (MoS2) in the spectral range from 1.24 eV to 3.22 eV (385 nm to 1000 nm) by developing a hyperspectral imaging technique that allows one to probe the optical properties with diffraction limited spatial resolution. We find hyperspectral imaging very suited to study indirect bandgap semiconductors, unlike photoluminescence that only provides high luminescence yield for direct gap semiconductors. Moreover, this work opens the door to study the spatial variation of the optical properties of other two-dimensional systems, including non-semiconducting materials where scanning photoluminescence cannot be employed.