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Harry M. Quiney

Harry M. Quiney contributes to research discovery and scholarly infrastructure.

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Published work

5 published item(s)

preprint2026arXiv

On optimization of Paganin's method for propagation-based X-ray phase-contrast imaging and tomography

Paganin's method for image reconstruction in propagation-based phase-contrast X-ray imaging and tomography has enjoyed broad acceptance in recent years, with over one thousand publications citing its use. The present paper discusses approaches to optimization of the method with respect to simple image quality metrics, such as signal-to-noise ratio and spatial resolution, as well as a reference-based metric corresponding to the relative mean squared difference between the reconstructed image and the "ground truth" image that would be obtained in a setup with perfect spatial resolution and no noise. The problem of optimization of the intrinsic regularization parameter of Paganin's method with respect to spatial resolution in the reconstructed image is studied in detail. It is also demonstrated that a combination of Paganin's method with a Tikhonov-regularized deconvolution of the point-spread function of the imaging system can provide significantly higher image quality compared to the standard version of the method. Analytical expressions for some relevant image quality metrics are obtained and compared with results of numerical simulations. Advantages and shortcomings of optimization approaches using a number of different image quality metrics are discussed. The results of this study are expected to be useful in practical X-ray imaging and training of deep machine learning models for image denoising and segmentation.

preprint2025arXiv

Symmetry-Checking in Band Structure Calculations on a Noisy Quantum Computer

Band crossings in electronic band structures play an important role in determining the electronic, topological, and transport properties in solid-state systems, making them central to both condensed matter physics and materials science. The emergence of noisy intermediate-scale quantum (NISQ) processors has sparked great interest in developing quantum algorithms to compute band structure properties of materials. While significant research has been reported on computing ground state and excited state energy bands in the presence of noise that breaks the degeneracy, identifying the symmetry at crossing points using quantum computers is still an open question. In this work, we propose a method for identifying the symmetry of bands around crossings and anti-crossings in the band structure of bilayer graphene with two distinct configurations on a NISQ device. The method utilizes eigenstates at neighbouring $\mathbf{k}$ points on either side of the touching point to recover the local symmetry by implementing a character-checking quantum circuit that uses ancilla qubit measurements for a probabilistic test. We then evaluate the performance of our method under a depolarizing noise model, using four distinct matrix representations of symmetry operations to assess its robustness. Finally, we demonstrate the reliability of our method by correctly identifying the correct band crossings of AA-stacked bilayer graphene around $K$ point, using the character-checking circuit implemented on a noisy IBM quantum processor $ibm\_marrakesh$.

preprint2020arXiv

Ptychographic X-ray Speckle Tracking

We present a method for the measurement of the phase gradient of a wavefront by tracking the relative motion of speckles in projection holograms as a sample is scanned across the wavefront. By removing the need to obtain an un-distorted reference image of the sample, this method is suitable for the metrology of highly divergent wavefields. Such wavefields allow for large magnification factors, that, according to current imaging capabilities, will allow for nano-radian angular sensitivity and nano-scale sample projection imaging. Both the reconstruction algorithm and the imaging geometry are nearly identical to that of ptychography, except that the sample is placed downstream of the beam focus and that no coherent propagation is explicitly accounted for. Like other x-ray speckle tracking methods, it is robust to low-coherence x-ray sources making is suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology. We also present a modified form of the speckle tracking approximation, based on a second-order local expansion of the Fresnel integral. This result extends the validity of the speckle tracking approximation and may be useful for similar approaches in the field.

preprint2020arXiv

speckle-tracking: a Software Suite for Ptychographic X-ray Speckle Tracking

In recent years, x-ray speckle tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to the simple experimental set-up, high angular sensitivity and compatibility with low coherence sources these methods have been actively developed for use with synchrotron and laboratory light sources. Not only do speckle-tracking techniques give the potential for high resolution imaging, but they also provide rapid and robust characterisation of aberrations of x-ray optical elements, focal spot profiles and the sample position and transmission properties. In order to realise these capabilities, we require software implementations that are equally rapid and robust. To address this need, a software suite has been developed for the "ptychographic x-ray speckle tracking technique" -- an x-ray speckle based method suitable for highly divergent wavefields. The software suite is written in Python 3, with an OpenCL back end for GPU and multi-CPU core processing. It is accessible as a Python module, through the command line or through a graphical user interface and is available as source code under version 3 or later of the GNU General Public License.

preprint2010arXiv

A novel approach for structure analysis of two-dimensional membrane protein crystals using x-ray powder diffraction data

The application of powder diffraction methods in two-dimensional crystallography is regarded as intractable because of the uncertainties associated with overlapping reflections. Here, we report an approach that resolves these ambiguities and provides reliable low-resolution phase information directly from powder diffraction data. We apply our method to the recovery of the structure of the bacteriorhodopsin (bR) molecule to a resolution of 7 angstroms using only powder diffraction data obtained from two-dimensional purple membrane (PM) crystals.