Source author record

G. M. Gibson

G. M. Gibson appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
3topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2022arXiv

Measuring Optical Activity with Unpolarised Light: Ghost Polarimetry

Quantifying the optical chirality of a sample requires the precise measurement of the rotation of the plane of linear polarisation of the transmitted light. Central to this notion is that the sample needs to be exposed to light of a defined polarisation state. We show that by using a polarisation-entangled photon source we can measure optical activity whilst illuminating a sample with unpolarised light. This not only allows for low light measurement of optical activity but also allows for the analysis of samples that would otherwise be perturbed if subject to polarised light.

preprint2016arXiv

Non-invasive, near-field terahertz imaging of hidden objects using a single pixel detector

Terahertz (THz) imaging has the ability to see through otherwise opaque materials. However, due to the long wavelengths of THz radiation (λ=300μm at 1THz), far-field THz imaging techniques are heavily outperformed by optical imaging in regards to the obtained resolution. In this work we demonstrate near-field THz imaging with a single-pixel detector. We project a time-varying optical mask onto a silicon wafer which is used to spatially modulate a pulse of THz radiation. The far-field transmission corresponding to each mask is recorded by a single element detector and this data is used to reconstruct the image of an object placed on the far side of the silicon wafer. We demonstrate a proof of principal application where we image a printed circuit board on the underside of a 115μm thick silicon wafer with ~100μm (λ/4) resolution. With subwavelength resolution and the inherent sensitivity to local conductivity provided by the THz probe frequencies, we show that it is possible to detect fissures in the circuitry wiring of a few microns in size. Imaging systems of this type could have other uses where non-invasive measurement or imaging of concealed structures with high resolution is necessary, such as in semiconductor manufacturing or in bio-imaging.