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Researcher profile

François Polack

François Polack contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-sciphysics.ins-detcond-mat.mes-hall

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2 published item(s)

preprint2012arXiv

ANTARES, a scanning photoemission microscopy beamline at SOLEIL

As one of the latest beamline built at the SOLEIL synchrotron source, ANTARES beamline offers a spectroscopic non-destructive nano-probe to study advanced materials. This innovative scanning photoemission microscopy combines linear and angle sweeps to perform precise electronic band structure determination by Nano Angle Resolved Photoelectron Spectroscopy (nanoARPES) and chemical imaging by core level detection. The beamline integrates effectively insertion devices and a high transmission beamline optics. This photon source has been combined with an advanced microscope, which has precise sample handling abilities. Moreover, it is fully compatible with a high resolution R4000 Scienta hemispherical analyzer and a set of Fresnel Zone Plates (FZP) able to focalize the beam spot up to a few tenths of nanometers, depending on the spatial resolution of the selected FZP. We present here the main conceptual design of the beamline and endstation, together with some of the firsts commissioning results.

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preprint2012arXiv

Interferometer-controlled soft X-ray scanning photoemission microscope at SOLEIL

ANTARES beamline (BL), a new soft X-ray scanning photoemission microscope located at the SOLEIL synchrotron storage ring has been recently designed, built and commissioned. The implemented interferometer control allows the accurate measurement of the transverse position of the Fresnel zone plate (FZP) relative to the sample. An effective sample position feedback has been achieved during experiments in static mode, with a fixed FZP position required to perform nano Angle-Resolved Photoelectron Spectroscopy (Nano-ARPES) measurements. Likewise, long-term stability has been attained for the FZP position relative to the sample during the translation of the FZP when performing typical X-ray absorption experiments around the absorption edges of light elements. Moreover, a fully automatic feedback digital control of the interferometric system provides extremely low orthogonal distortion of the recorded two-dimensional images. The microscope is diffraction limited with the resolution set to several tens of nanometers by the quality of the zone plates. Details on the design of the interferometric system and a brief description of the first commissioning results are presented here.

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