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F. J. Giessibl

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cond-mat.mtrl-sci cond-mat.mes-hall physics.ins-det

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preprint2011arXiv

A phantom force induced by the tunneling current, characterized on Si(111)

Simultaneous measurements of tunneling currents and atomic forces on surfaces and adsorbates provide new insights into the electronic and structural properties of matter on the atomic scale. We report on experimental observations and calculations of a strong impact the tunneling current can have on the measured force, which arises when the resistivity of the sample cannot be neglected. We present a study on Si(111)-7\times7 with various doping levels, but this effect is expected to occur on other low-conductance samples like adsorbed molecules, and is likely to strongly affect Kelvin probe measurements on the atomic scale.

preprint2011arXiv

qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution

Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the atomic arrangement of individual electron spins. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the force gradients of the interactions responsible for atomic contrast and those causing domain contrast are orders of magnitude apart - ranging from up to 100N/m for atomic interactions down to 0.0001N/m for magnetic dipole interactions. Here, we show that this gap can be bridged with a qPlus sensor, with a stiffness of 1800N/m (optimized for atomic interaction), that is sensitive enough to measure milli-Hertz frequency contrast caused by magnetic dipole-dipole interactions. Thus we have succeeded to establish a sensing technique that performs Scanning Tunneling Microscopy, Atomic Force Microscopy and MFM with a single probe.

preprint2001arXiv

Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.