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Researcher profile

Erik A. Tholen

Erik A. Tholen contributes to research discovery and scholarly infrastructure.

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Published work

5 published item(s)

preprint2013arXiv

Interaction imaging with amplitude-dependence force spectroscopy

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic AFM has been enormously successful in imaging surface topography, even to atomic resolution, but the force between the AFM tip and the surface remains unknown during imaging. Here, we present a new approach that combines high accuracy force measurements and high resolution scanning. The method, called amplitude-dependence force spectroscopy (ADFS) is based on the amplitude-dependence of the cantilever's response near resonance and allows for separate determination of both conservative and dissipative tip-surface interactions. We use ADFS to quantitatively study and map the nano-mechanical interaction between the AFM tip and heterogeneous polymer surfaces. ADFS is compatible with commercial atomic force microscopes and we anticipate its wide-spread use in taking AFM toward quantitative microscopy.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Polynomial force approximations and multifrequency atomic force microscopy

We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy. Based on polynomial force reconstruction we generate high-resolution surface property maps of polymer blend samples. The polynomial method is described as a special example of a more general approximataive force reconstruction, where the aim is to determine model parameters which best approximate the measured force spectrum. This approximative approach is not limited to spectral data and we demonstrate how is can adapted to a force quadrature picture.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Simultaneous quantitative imaging of surface and magnetic forces

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging of these forces is performed in both the contact and non-contact regimes of near-surface interactions.

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preprint2010arXiv

The Intermodulation Lockin Analyzer

Nonlinear systems can be probed by driving them with two or more pure tones while measuring the intermodulation products of the drive tones in the response. We describe a digital lock-in analyzer which is designed explicitly for this purpose. The analyzer is implemented on a field-programmable gate array, providing speed in analysis, real-time feedback and stability in operation. The use of the analyzer is demonstrated for Intermodulation Atomic Force Microscopy. A generalization of the intermodulation spectral technique to arbitrary drive waveforms is discussed.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

Phase imaging with intermodulation atomic force microscopy

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.

0 citations0 reviewsNo code linkedOpen access