Nanoscale Thermal Imaging of VO via Poole-Frenkel Conduction
We present a method for nanoscale thermal imaging of insulating thin films using atomic force microscopy (AFM), and we demonstrate its utility on VO. We sweep the applied voltage to a conducting AFM tip in contact mode and measure the local current through the film. By fitting the curves to a Poole-Frenkel conduction model at low , we calculate the local temperature with spatial resolution better than 50 nm using only fundamental constants and known film properties. Our thermometry technique enables local temperature measurement of \textit{any} insulating film dominated by the Poole-Frenkel conduction mechanism, and can be extended to insulators that display other conduction mechanisms.