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Ekkehart Schmidt

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Published work

2 published item(s)

preprint2026arXiv

Towards High-Efficiency Particle Detection Using Superconducting Microwire Arrays

We present a detailed study of an 8-channel $1\times1$ mm$^{2}$ WSi superconducting microwire single photon detector (SMSPD) array exposed to 120 GeV hadron beam and 120 GeV muon beam at the CERN Super Proton Synchrotron H6 beamline. Following up on our first detailed characterization of the efficiency and response of an SMSPD fabricated on a 3 nm WSi film, we report measurements of enhanced particle detection efficiency using a sensor fabricated from a thicker 4.7nm-thick WSi film. We also report the first SMSPD detection efficiency measurement made for muons. Measurements are enabled by a silicon tracking telescope providing 10 $μ$m in-situ spatial resolution. The results show a fill factor-normalized detection efficiency of 75% and a time resolution of about 130 ps across pixels. These findings represent a significant advancement toward developing high-efficiency SMSPD charged particle tracking systems with simultaneous precision timing, with potential applications in future accelerator-based experiments such as the FCC-ee and Muon Collider.

preprint2020arXiv

Enhancing the Performance of Superconducting Nanowire-Based Detectors with High-Filling Factor by Using Variable Thickness

Current crowding at bends of superconducting nanowire single-photon detectors is one of the main factors limiting the performance of meander-style detectors with large filling factors. In this paper, we propose a new concept to reduce influence of the current crowding effect, a so-called variable thickness SNSPD, which is composed of two regions with different thicknesses. A larger thickness of bends in comparison to the thickness of straight nanowire sections locally reduces the current density and reduces the suppression of the critical current caused by the current crowding. This allows variable thickness SNSPD to have a higher critical current, an improved detection efficiency, and decreased dark count rate in comparison with a standard uniform thickness SNSPD with an identical geometry and film quality.